Challenges in polarization ray tracing

Research output: Chapter in Book/Report/Conference proceedingConference contribution


New polarization methods allow the ray tracing simulation of polarization critical components, including multilayer biaxial films, anisotropic and gyrotropic crystals, electro-optical, magneto-optical, and stressoptical modulators, photonic crystals and meta-materials.

Original languageEnglish (US)
Title of host publicationInternational Optical Design Conference, IODC 2010
StatePublished - Dec 1 2010
EventInternational Optical Design Conference, IODC 2010 - Jackson Hole, WY, United States
Duration: Jun 13 2010Jun 17 2010

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701


OtherInternational Optical Design Conference, IODC 2010
CountryUnited States
CityJackson Hole, WY

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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    Chipman, R. A. (2010). Challenges in polarization ray tracing. In International Optical Design Conference, IODC 2010 (Optics InfoBase Conference Papers).