Challenges in polarization ray tracing

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

New polarization methods allow the ray tracing simulation of polarization critical components, including multilayer biaxial films, anisotropic and gyrotropic crystals, electro-optical, and magneto-optical materials bring many new challenges.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume7652
DOIs
StatePublished - 2010
EventInternational Optical Design Conference 2010 - Jackson Hole, WY, United States
Duration: Jun 13 2010Jun 17 2010

Other

OtherInternational Optical Design Conference 2010
CountryUnited States
CityJackson Hole, WY
Period6/13/106/17/10

Fingerprint

Ray Tracing
Ray tracing
ray tracing
Polarization
Optical Materials
Optical materials
Biaxial
Multilayer films
optical materials
polarization
Multilayer
Crystal
Crystals
crystals
Simulation
simulation

Keywords

  • biaxial materials
  • birefringent material
  • Polarization ray tracing

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Chipman, R. A. (2010). Challenges in polarization ray tracing. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 7652). [76521U] https://doi.org/10.1117/12.868939

Challenges in polarization ray tracing. / Chipman, Russell A.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7652 2010. 76521U.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chipman, RA 2010, Challenges in polarization ray tracing. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 7652, 76521U, International Optical Design Conference 2010, Jackson Hole, WY, United States, 6/13/10. https://doi.org/10.1117/12.868939
Chipman RA. Challenges in polarization ray tracing. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7652. 2010. 76521U https://doi.org/10.1117/12.868939
Chipman, Russell A. / Challenges in polarization ray tracing. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7652 2010.
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