Challenges in polarization ray tracing

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

New polarization methods allow the ray tracing simulation of polarization critical components, including multilayer biaxial films, anisotropic and gyrotropic crystals, electro-optical, and magneto-optical materials bring many new challenges.

Original languageEnglish (US)
Title of host publicationInternational Optical Design Conference 2010
DOIs
StatePublished - Nov 8 2010
EventInternational Optical Design Conference 2010 - Jackson Hole, WY, United States
Duration: Jun 13 2010Jun 17 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7652
ISSN (Print)0277-786X

Other

OtherInternational Optical Design Conference 2010
CountryUnited States
CityJackson Hole, WY
Period6/13/106/17/10

Keywords

  • Polarization ray tracing
  • biaxial materials
  • birefringent material

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Chipman, R. A. (2010). Challenges in polarization ray tracing. In International Optical Design Conference 2010 [76521U] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7652). https://doi.org/10.1117/12.868939