Characteristics of the depth of focus in a high-NA optical system with a SIAX for data storage

Jaisoon Kim, Moonseok Kim, Sukjoon Hong, Tom D. Milster

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

We study the tolerance characteristic of SIAX and suggest a newly designed SIL-Axicon system for the better tolerances. Methods for checking beam quality, optimization and remaining problems are suggested. SIL-Axicon system shows more tolerances in the uniformity of beam incident angle. Bessel beam (BB) with SIL can be used for multi layer high density data storage systems. We study the tolerance characteristic of SIAX and suggest a newly designed SIL-Axicon system for the better tolerances.

Original languageEnglish (US)
Title of host publicationOptical Data Storage 2010
DOIs
StatePublished - Nov 8 2010
EventOptical Data Storage 2010 - Boulder, CO, United States
Duration: May 23 2010May 26 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7730
ISSN (Print)0277-786X

Other

OtherOptical Data Storage 2010
CountryUnited States
CityBoulder, CO
Period5/23/105/26/10

Keywords

  • Bessel beam
  • SIAX
  • SIL-Axicon
  • optical data storage

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Characteristics of the depth of focus in a high-NA optical system with a SIAX for data storage'. Together they form a unique fingerprint.

  • Cite this

    Kim, J., Kim, M., Hong, S., & Milster, T. D. (2010). Characteristics of the depth of focus in a high-NA optical system with a SIAX for data storage. In Optical Data Storage 2010 [77300M] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7730). https://doi.org/10.1117/12.859234