Characteristics of the depth of focus in a high-NA optical system with a SIAX for data storage

Jaisoon Kim, Moonseok Kim, Sukjoon Hong, Thomas D Milster

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

We study the tolerance characteristic of SIAX and suggest a newly designed SIL-Axicon system for the better tolerances. Methods for checking beam quality, optimization and remaining problems are suggested. SIL-Axicon system shows more tolerances in the uniformity of beam incident angle. Bessel beam (BB) with SIL can be used for multi layer high density data storage systems. We study the tolerance characteristic of SIAX and suggest a newly designed SIL-Axicon system for the better tolerances.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume7730
DOIs
StatePublished - 2010
EventOptical Data Storage 2010 - Boulder, CO, United States
Duration: May 23 2010May 26 2010

Other

OtherOptical Data Storage 2010
CountryUnited States
CityBoulder, CO
Period5/23/105/26/10

Fingerprint

Depth of Focus
Data Storage
data storage
Optical systems
Optical System
Tolerance
Data storage equipment
Bessel Beam
Beam Quality
Beam quality
Storage System
optimization
Uniformity
Multilayer
Angle
Optimization

Keywords

  • Bessel beam
  • optical data storage
  • SIAX
  • SIL-Axicon

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Kim, J., Kim, M., Hong, S., & Milster, T. D. (2010). Characteristics of the depth of focus in a high-NA optical system with a SIAX for data storage. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 7730). [77300M] https://doi.org/10.1117/12.859234

Characteristics of the depth of focus in a high-NA optical system with a SIAX for data storage. / Kim, Jaisoon; Kim, Moonseok; Hong, Sukjoon; Milster, Thomas D.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7730 2010. 77300M.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kim, J, Kim, M, Hong, S & Milster, TD 2010, Characteristics of the depth of focus in a high-NA optical system with a SIAX for data storage. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 7730, 77300M, Optical Data Storage 2010, Boulder, CO, United States, 5/23/10. https://doi.org/10.1117/12.859234
Kim J, Kim M, Hong S, Milster TD. Characteristics of the depth of focus in a high-NA optical system with a SIAX for data storage. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7730. 2010. 77300M https://doi.org/10.1117/12.859234
Kim, Jaisoon ; Kim, Moonseok ; Hong, Sukjoon ; Milster, Thomas D. / Characteristics of the depth of focus in a high-NA optical system with a SIAX for data storage. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7730 2010.
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