Characterization of a bit-wise volumetric storage medium for a space environment

Y. Zhang, J. Butz, J. Curtis, N. Beaudry, W. L. Bletscher, K. J. Erwin, D. Knight, Thomas D Milster, E. Walker

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

We report playback performance results of volumetric optical data storage disks that are made from a class of light-absorbing (photo-chromic) compounds. The disks are exposed to a simulated space environment with respect to temperature and radiation. To test for temperature sensitivity, a vacuum oven bakes the disks for certain amount of time at a designated temperature. Radiation exposure includes heavy ions and high energy protons. Disks fail in high temperature and large proton-dose conditions. Heavy ions do not cause significant disk failure. The prevention of disk failure due to harsh space environments is also discussed.

Original languageEnglish (US)
Pages (from-to)2662-2669
Number of pages8
JournalOptics Express
Volume12
Issue number12
DOIs
StatePublished - 2004

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aerospace environments
heavy ions
playbacks
ovens
radiation dosage
data storage
proton energy
temperature
dosage
vacuum
protons
causes
radiation

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Zhang, Y., Butz, J., Curtis, J., Beaudry, N., Bletscher, W. L., Erwin, K. J., ... Walker, E. (2004). Characterization of a bit-wise volumetric storage medium for a space environment. Optics Express, 12(12), 2662-2669. https://doi.org/10.1364/OPEX.12.002662

Characterization of a bit-wise volumetric storage medium for a space environment. / Zhang, Y.; Butz, J.; Curtis, J.; Beaudry, N.; Bletscher, W. L.; Erwin, K. J.; Knight, D.; Milster, Thomas D; Walker, E.

In: Optics Express, Vol. 12, No. 12, 2004, p. 2662-2669.

Research output: Contribution to journalArticle

Zhang, Y, Butz, J, Curtis, J, Beaudry, N, Bletscher, WL, Erwin, KJ, Knight, D, Milster, TD & Walker, E 2004, 'Characterization of a bit-wise volumetric storage medium for a space environment', Optics Express, vol. 12, no. 12, pp. 2662-2669. https://doi.org/10.1364/OPEX.12.002662
Zhang Y, Butz J, Curtis J, Beaudry N, Bletscher WL, Erwin KJ et al. Characterization of a bit-wise volumetric storage medium for a space environment. Optics Express. 2004;12(12):2662-2669. https://doi.org/10.1364/OPEX.12.002662
Zhang, Y. ; Butz, J. ; Curtis, J. ; Beaudry, N. ; Bletscher, W. L. ; Erwin, K. J. ; Knight, D. ; Milster, Thomas D ; Walker, E. / Characterization of a bit-wise volumetric storage medium for a space environment. In: Optics Express. 2004 ; Vol. 12, No. 12. pp. 2662-2669.
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