Characterization of a photochromic bit-wise volumetric storage media for space applications

Yan Zhang, John Butz, Jason Curtis, Neil Beaudry, Warren L. Bletscher, Kevin J. Erwin, Dak Knight, Thomas D Milster, Ed Walker

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We report playback performance results of volumetric optical data storage disks that are made from a new class of light-absorbing (photo-chromic) compounds. The disks are first exposed to a simulated space environment. In order to simulate the space environment, a vacuum oven bakes the disks for certain amount of time at a designated temperature. Test results in this temperature study are fit into an Arrhenius model. Disks are also exposed to radiation doses similar to those found in a space environment. Disks fail in high temperature and large proton-dose conditions. Heavy ions do not cause significant disk failure. The prevention of disk failure due to harsh space environments is also discussed.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Pages286-293
Number of pages8
Volume5069
DOIs
Publication statusPublished - 2003
EventOptical Data Storage 2003 - Vancouver, BC, Canada
Duration: May 11 2003May 14 2003

Other

OtherOptical Data Storage 2003
CountryCanada
CityVancouver, BC
Period5/11/035/14/03

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Keywords

  • Radiation
  • Signal-to-noise ratio
  • Volumetric data storage

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Zhang, Y., Butz, J., Curtis, J., Beaudry, N., Bletscher, W. L., Erwin, K. J., ... Walker, E. (2003). Characterization of a photochromic bit-wise volumetric storage media for space applications. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 5069, pp. 286-293) https://doi.org/10.1117/12.533090