Characterization of carbon nanotubes by scanning probe microscopy

Mark J. Gallagher, Dong Chen, Bruce P. Jacobsen, Dror Sarid, Lowell D. Lamb, Frank A. Tinker, Jun Jiao, Donald R. Huffman, Supapan Seraphin, Dan Zhou

Research output: Contribution to journalArticle

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Abstract

Carbon nanotubes, fabricated by the Ebbesen-Ajayan method, were imaged using scanning tunneling microscopy (STM) and atomic force microscopy (AFM) in air and were compared to images obtained with high-resolution transmission electron microscopy (HRTEM). The HRTEM images revealed an abundance of elongated structures ranging in diameter from 3.0 to 30 nm, and with lengths of up to 0.8 μm. Many of the structures possessed several graphitic shells as if the tubes were nested one in the other. Reproducible images of the tubular structures, typically 20 nm in diameter and with a large variation in length, were obtained with both STM and AFM when the nanotubes were deposited on hydrogen-terminated Si(111), confirming that the nested structures observed with HRTEM do indeed have a tubular morphology. No single-walled, bare nanotubes or spherical fullerenes (typical of the Krätschmer-Huffman process) were observed.

Original languageEnglish (US)
JournalSurface Science
Volume281
Issue number3
DOIs
StatePublished - Feb 1 1993

Fingerprint

Scanning probe microscopy
Carbon Nanotubes
High resolution transmission electron microscopy
Carbon nanotubes
carbon nanotubes
Scanning tunneling microscopy
microscopy
Nanotubes
transmission electron microscopy
scanning
probes
scanning tunneling microscopy
Atomic force microscopy
high resolution
nanotubes
atomic force microscopy
Fullerenes
fullerenes
Hydrogen
tubes

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Gallagher, M. J., Chen, D., Jacobsen, B. P., Sarid, D., Lamb, L. D., Tinker, F. A., ... Zhou, D. (1993). Characterization of carbon nanotubes by scanning probe microscopy. Surface Science, 281(3). https://doi.org/10.1016/0039-6028(93)90632-T

Characterization of carbon nanotubes by scanning probe microscopy. / Gallagher, Mark J.; Chen, Dong; Jacobsen, Bruce P.; Sarid, Dror; Lamb, Lowell D.; Tinker, Frank A.; Jiao, Jun; Huffman, Donald R.; Seraphin, Supapan; Zhou, Dan.

In: Surface Science, Vol. 281, No. 3, 01.02.1993.

Research output: Contribution to journalArticle

Gallagher, MJ, Chen, D, Jacobsen, BP, Sarid, D, Lamb, LD, Tinker, FA, Jiao, J, Huffman, DR, Seraphin, S & Zhou, D 1993, 'Characterization of carbon nanotubes by scanning probe microscopy', Surface Science, vol. 281, no. 3. https://doi.org/10.1016/0039-6028(93)90632-T
Gallagher MJ, Chen D, Jacobsen BP, Sarid D, Lamb LD, Tinker FA et al. Characterization of carbon nanotubes by scanning probe microscopy. Surface Science. 1993 Feb 1;281(3). https://doi.org/10.1016/0039-6028(93)90632-T
Gallagher, Mark J. ; Chen, Dong ; Jacobsen, Bruce P. ; Sarid, Dror ; Lamb, Lowell D. ; Tinker, Frank A. ; Jiao, Jun ; Huffman, Donald R. ; Seraphin, Supapan ; Zhou, Dan. / Characterization of carbon nanotubes by scanning probe microscopy. In: Surface Science. 1993 ; Vol. 281, No. 3.
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