Characterization of DKIST retarder components with polarization ray tracing

Stacey R. Sueoka, Russell A Chipman, David F. Elmore

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)

Abstract

Super achromatic retarders and polychromatic modulators are required to meet the polarimetry specifications of the Daniel K. Inouye Solar Telescope. These components have been analyzed and toleranced using a birefringent polarization ray trace over wavelength and field of view.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume9293
ISBN (Print)9781628413786
DOIs
StatePublished - 2014
EventInternational Optical Design Conference 2014, IODC 2014 - Kohala Coast, United States
Duration: Jun 23 2014Jun 26 2014

Other

OtherInternational Optical Design Conference 2014, IODC 2014
CountryUnited States
CityKohala Coast
Period6/23/146/26/14

Fingerprint

Solar Telescope
Polarimetry
retarders
Polarimeters
Ray Tracing
polarimetry
Ray tracing
Modulator
Field of View
ray tracing
Telescopes
Modulators
field of view
Half line
specifications
modulators
rays
Polarization
Trace
telescopes

Keywords

  • Anisotropic optical materials
  • Polarization
  • Polarization ray trace
  • Super achromatic retarder

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Sueoka, S. R., Chipman, R. A., & Elmore, D. F. (2014). Characterization of DKIST retarder components with polarization ray tracing. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 9293). [929308] SPIE. https://doi.org/10.1117/12.2071279

Characterization of DKIST retarder components with polarization ray tracing. / Sueoka, Stacey R.; Chipman, Russell A; Elmore, David F.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9293 SPIE, 2014. 929308.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Sueoka, SR, Chipman, RA & Elmore, DF 2014, Characterization of DKIST retarder components with polarization ray tracing. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 9293, 929308, SPIE, International Optical Design Conference 2014, IODC 2014, Kohala Coast, United States, 6/23/14. https://doi.org/10.1117/12.2071279
Sueoka SR, Chipman RA, Elmore DF. Characterization of DKIST retarder components with polarization ray tracing. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9293. SPIE. 2014. 929308 https://doi.org/10.1117/12.2071279
Sueoka, Stacey R. ; Chipman, Russell A ; Elmore, David F. / Characterization of DKIST retarder components with polarization ray tracing. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9293 SPIE, 2014.
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