Characterization of frequency dependent dielectric packaging media using differential and multiple-reflection techniques on a precision stripline test structure

Ch C. Green, J. M. Seligman, J. L. Prince, K. L. Virga

Research output: Contribution to conferencePaper

Abstract

The frequency dependent loss tangent and dielectric constant has been determined for various dielectric materials using a stripline test fixture by employing differential and multiple-reflection-based measurement techniques with a vector network analyzer.

Original languageEnglish (US)
Pages69-72
Number of pages4
StatePublished - Dec 1 1998
EventProceedings of the 1998 IEEE 7th Topical Meeting on Electrical Performance of Electronic Packaging - West Point, NY, USA
Duration: Oct 26 1998Oct 28 1998

Conference

ConferenceProceedings of the 1998 IEEE 7th Topical Meeting on Electrical Performance of Electronic Packaging
CityWest Point, NY, USA
Period10/26/9810/28/98

ASJC Scopus subject areas

  • Engineering(all)

Fingerprint Dive into the research topics of 'Characterization of frequency dependent dielectric packaging media using differential and multiple-reflection techniques on a precision stripline test structure'. Together they form a unique fingerprint.

  • Cite this

    Green, C. C., Seligman, J. M., Prince, J. L., & Virga, K. L. (1998). Characterization of frequency dependent dielectric packaging media using differential and multiple-reflection techniques on a precision stripline test structure. 69-72. Paper presented at Proceedings of the 1998 IEEE 7th Topical Meeting on Electrical Performance of Electronic Packaging, West Point, NY, USA, .