Characterization of Ge 2Sb 2Te 5 thin film alloys using conductive-tip atomic force microscopy

Chia Min Chang, Yen Ju Liu, Ming Lun Tseng, Nien Nan Chu, Ding Wei Huang, Masud Mansuripur, Din Ping Tsai

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Conductive-tip atomic force microscopy (C-AFM) is a powerful tool for investigating the electrical characteristics of phase-change materials commonly used for electronic and optical data storage. We demonstrate the usefulness of this technique by examining the electrical conductivity of crystalline marks recorded with a focused laser pulse on a thin Ge 2Sb 2Te 5 film.

Original languageEnglish (US)
Pages (from-to)1945-1950
Number of pages6
JournalPhysica Status Solidi (B) Basic Research
Volume249
Issue number10
DOIs
StatePublished - Oct 2012

Fingerprint

Optical data storage
phase change materials
Phase change materials
data storage
Laser pulses
Atomic force microscopy
atomic force microscopy
Crystalline materials
Thin films
electrical resistivity
thin films
pulses
electronics
lasers
Electric Conductivity

Keywords

  • Electronic data storage
  • Materials and process characterization
  • Optical recording
  • Phase-change materials

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

Cite this

Characterization of Ge 2Sb 2Te 5 thin film alloys using conductive-tip atomic force microscopy. / Chang, Chia Min; Liu, Yen Ju; Tseng, Ming Lun; Chu, Nien Nan; Huang, Ding Wei; Mansuripur, Masud; Tsai, Din Ping.

In: Physica Status Solidi (B) Basic Research, Vol. 249, No. 10, 10.2012, p. 1945-1950.

Research output: Contribution to journalArticle

Chang, Chia Min ; Liu, Yen Ju ; Tseng, Ming Lun ; Chu, Nien Nan ; Huang, Ding Wei ; Mansuripur, Masud ; Tsai, Din Ping. / Characterization of Ge 2Sb 2Te 5 thin film alloys using conductive-tip atomic force microscopy. In: Physica Status Solidi (B) Basic Research. 2012 ; Vol. 249, No. 10. pp. 1945-1950.
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