Characterization of indium-tin oxide interfaces using X-ray photoelectron spectroscopy and redox processes of a chemisorbed probe molecule: Effect of surface pretreatment conditions

Carrie Donley, Darren Dunphy, David Paine, Chet Carter, Ken Nebesny, Paul Lee, Dana Alloway, Neal R Armstrong

Research output: Contribution to journalArticle

242 Citations (Scopus)

Abstract

Surface characterization of indium-tin oxide (ITO) thin films has been carried out with monochromatic X-ray photoelectron spectroscopy (XPS) following various solution pretreatments, RF air plasma etching or high-vacuum argon-ion sputtering. Commercially available ITO films show high concentrations of hydrolyzed oxides and oxy-hydroxides in the near-surface region, along with stoichiometric oxide (In2O3, SnO2) and variable levels of oxygen defect sites. XPS revealed that solution and vacuum treatments changed both the relative surface coverage of the hydroxides and, to a lesser extent, the concentration of oxide defect sites in the near-surface region. These pretreatments have a significant effect on both the coverage and electron-transfer rates for chemisorbed ferrocene dicarboxylic acid (Fc(COOH)2), with the air-plasma-etched ITO showing the highest surface coverage of Fc(COOH)2 and an RCA treatment showing the highest electron-transfer rates.

Original languageEnglish (US)
Pages (from-to)450-457
Number of pages8
JournalLangmuir
Volume18
Issue number2
DOIs
StatePublished - Jan 22 2002

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Tin oxides
pretreatment
indium oxides
Indium
tin oxides
X ray photoelectron spectroscopy
photoelectron spectroscopy
Molecules
Hydroxides
probes
Oxides
molecules
x rays
hydroxides
Oxide films
oxides
electron transfer
Vacuum
Defects
Electrons

ASJC Scopus subject areas

  • Colloid and Surface Chemistry
  • Physical and Theoretical Chemistry

Cite this

Characterization of indium-tin oxide interfaces using X-ray photoelectron spectroscopy and redox processes of a chemisorbed probe molecule : Effect of surface pretreatment conditions. / Donley, Carrie; Dunphy, Darren; Paine, David; Carter, Chet; Nebesny, Ken; Lee, Paul; Alloway, Dana; Armstrong, Neal R.

In: Langmuir, Vol. 18, No. 2, 22.01.2002, p. 450-457.

Research output: Contribution to journalArticle

Donley, Carrie ; Dunphy, Darren ; Paine, David ; Carter, Chet ; Nebesny, Ken ; Lee, Paul ; Alloway, Dana ; Armstrong, Neal R. / Characterization of indium-tin oxide interfaces using X-ray photoelectron spectroscopy and redox processes of a chemisorbed probe molecule : Effect of surface pretreatment conditions. In: Langmuir. 2002 ; Vol. 18, No. 2. pp. 450-457.
@article{3877d656f5b04c2ba6dc1fa5730f2445,
title = "Characterization of indium-tin oxide interfaces using X-ray photoelectron spectroscopy and redox processes of a chemisorbed probe molecule: Effect of surface pretreatment conditions",
abstract = "Surface characterization of indium-tin oxide (ITO) thin films has been carried out with monochromatic X-ray photoelectron spectroscopy (XPS) following various solution pretreatments, RF air plasma etching or high-vacuum argon-ion sputtering. Commercially available ITO films show high concentrations of hydrolyzed oxides and oxy-hydroxides in the near-surface region, along with stoichiometric oxide (In2O3, SnO2) and variable levels of oxygen defect sites. XPS revealed that solution and vacuum treatments changed both the relative surface coverage of the hydroxides and, to a lesser extent, the concentration of oxide defect sites in the near-surface region. These pretreatments have a significant effect on both the coverage and electron-transfer rates for chemisorbed ferrocene dicarboxylic acid (Fc(COOH)2), with the air-plasma-etched ITO showing the highest surface coverage of Fc(COOH)2 and an RCA treatment showing the highest electron-transfer rates.",
author = "Carrie Donley and Darren Dunphy and David Paine and Chet Carter and Ken Nebesny and Paul Lee and Dana Alloway and Armstrong, {Neal R}",
year = "2002",
month = "1",
day = "22",
doi = "10.1021/la011101t",
language = "English (US)",
volume = "18",
pages = "450--457",
journal = "Langmuir",
issn = "0743-7463",
publisher = "American Chemical Society",
number = "2",

}

TY - JOUR

T1 - Characterization of indium-tin oxide interfaces using X-ray photoelectron spectroscopy and redox processes of a chemisorbed probe molecule

T2 - Effect of surface pretreatment conditions

AU - Donley, Carrie

AU - Dunphy, Darren

AU - Paine, David

AU - Carter, Chet

AU - Nebesny, Ken

AU - Lee, Paul

AU - Alloway, Dana

AU - Armstrong, Neal R

PY - 2002/1/22

Y1 - 2002/1/22

N2 - Surface characterization of indium-tin oxide (ITO) thin films has been carried out with monochromatic X-ray photoelectron spectroscopy (XPS) following various solution pretreatments, RF air plasma etching or high-vacuum argon-ion sputtering. Commercially available ITO films show high concentrations of hydrolyzed oxides and oxy-hydroxides in the near-surface region, along with stoichiometric oxide (In2O3, SnO2) and variable levels of oxygen defect sites. XPS revealed that solution and vacuum treatments changed both the relative surface coverage of the hydroxides and, to a lesser extent, the concentration of oxide defect sites in the near-surface region. These pretreatments have a significant effect on both the coverage and electron-transfer rates for chemisorbed ferrocene dicarboxylic acid (Fc(COOH)2), with the air-plasma-etched ITO showing the highest surface coverage of Fc(COOH)2 and an RCA treatment showing the highest electron-transfer rates.

AB - Surface characterization of indium-tin oxide (ITO) thin films has been carried out with monochromatic X-ray photoelectron spectroscopy (XPS) following various solution pretreatments, RF air plasma etching or high-vacuum argon-ion sputtering. Commercially available ITO films show high concentrations of hydrolyzed oxides and oxy-hydroxides in the near-surface region, along with stoichiometric oxide (In2O3, SnO2) and variable levels of oxygen defect sites. XPS revealed that solution and vacuum treatments changed both the relative surface coverage of the hydroxides and, to a lesser extent, the concentration of oxide defect sites in the near-surface region. These pretreatments have a significant effect on both the coverage and electron-transfer rates for chemisorbed ferrocene dicarboxylic acid (Fc(COOH)2), with the air-plasma-etched ITO showing the highest surface coverage of Fc(COOH)2 and an RCA treatment showing the highest electron-transfer rates.

UR - http://www.scopus.com/inward/record.url?scp=0037154486&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0037154486&partnerID=8YFLogxK

U2 - 10.1021/la011101t

DO - 10.1021/la011101t

M3 - Article

AN - SCOPUS:0037154486

VL - 18

SP - 450

EP - 457

JO - Langmuir

JF - Langmuir

SN - 0743-7463

IS - 2

ER -