Characterization of orthogonal transfer array CCDs for the WIYN one degree imager

Michael Lesser, David Ouellette, Todd Boroson, Daniel Harbeck, Pierre Martin, George Jacoby, John Cavin, David Sawyer, Kasey Boggs, Richard Bredthauer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

The WIYN One Degree Imager (ODI) will provide a one degree field of view for the WIYN 3.5 m telescope located on Kitt Peak near Tucson, Arizona. Its focal plane consists of an 8x8 grid of Orthogonal Transfer Array (OTA) CCD detectors. These detectors are the STA2200 OTA CCDs designed and fabricated by Semiconductor Technology Associates, Inc. and backside processed at the University of Arizona Imaging Technology Laboratory. Several lot runs of the STA2200 detectors have been fabricated. We have backside processed devices from these different lots and provide detector performance characterization, including noise, CTE, cosmetics, quantum efficiency, and some orthogonal transfer characteristics. We discuss the performance differences for the devices with different silicon thickness and resistivity. A fully buttable custom detector package has been developed for this project which allows hybridization of the silicon detectors directly onto an aluminum nitride substrate with an embedded pin grid array. This package is mounted on a silicon-aluminum alloy which provides a flat imaging surface of less than 20 microns peakvalley at the -100 C operating temperature. Characterization of the package performance, including low temperature profilometry, is described in this paper.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE-IS and T Electronic Imaging - Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII
PublisherSPIE
ISBN (Print)9780819489456
DOIs
StatePublished - 2012
EventSensors, Cameras, and Systems for Industrial and Scientific Applications XIII - Burlingame, CA, United States
Duration: Jan 25 2012Jan 26 2012

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8298
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherSensors, Cameras, and Systems for Industrial and Scientific Applications XIII
CountryUnited States
CityBurlingame, CA
Period1/25/121/26/12

Keywords

  • CCDs
  • Detectors
  • Imaging
  • Telescopes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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