Characterization of phosphonic acid binding to zinc oxide

Peter J. Hotchkiss, Michał Malicki, Anthony J. Giordano, Neal R Armstrong, Seth R. Marder

Research output: Contribution to journalArticle

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Abstract

Radio Frequency (RF) sputter-deposited zinc oxide (ZnO) films have been modified with alkylphosphonic acids in order to study both the binding of the phosphonic acid (PA) group to the ZnO surface and the packing of the alkyl chain. The characterization of these PA-modified ZnO substrates by X-ray photoelectron spectroscopy (XPS), infrared reflection-absorption spectroscopy (IRRAS), atomic force microscopy (AFM) and contact angle measurements is presented herein. The surface modification procedure is straightforward and was adapted from earlier work. XPS analysis shows that oxygen plasma (OP) treatment creates reactive oxygen species on the surface of ZnO, allowing for a more robust binding of PAs to the ZnO surface. IRRAS analysis indicates that octadecylphosphonic acid binds to the ZnO surface in a predominantly tridentate fashion, forming dense, well-packed monolayers with alkyl chains in a fully anti-conformation. AFM and contact angle measurements indicate good surface coverage of the PAs with little to no multilayer formation.

Original languageEnglish (US)
Pages (from-to)3107-3112
Number of pages6
JournalJournal of Materials Chemistry
Volume21
Issue number9
DOIs
StatePublished - Mar 7 2011

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Zinc Oxide
Zinc oxide
Acids
Angle measurement
Absorption spectroscopy
Contact angle
Atomic force microscopy
X ray photoelectron spectroscopy
Infrared radiation
Oxygen
Oxide films
Surface treatment
Conformations
phosphonic acid
Monolayers
Reactive Oxygen Species
Multilayers
Plasmas
Substrates

ASJC Scopus subject areas

  • Materials Chemistry
  • Chemistry(all)

Cite this

Hotchkiss, P. J., Malicki, M., Giordano, A. J., Armstrong, N. R., & Marder, S. R. (2011). Characterization of phosphonic acid binding to zinc oxide. Journal of Materials Chemistry, 21(9), 3107-3112. https://doi.org/10.1039/c0jm02829k

Characterization of phosphonic acid binding to zinc oxide. / Hotchkiss, Peter J.; Malicki, Michał; Giordano, Anthony J.; Armstrong, Neal R; Marder, Seth R.

In: Journal of Materials Chemistry, Vol. 21, No. 9, 07.03.2011, p. 3107-3112.

Research output: Contribution to journalArticle

Hotchkiss, PJ, Malicki, M, Giordano, AJ, Armstrong, NR & Marder, SR 2011, 'Characterization of phosphonic acid binding to zinc oxide', Journal of Materials Chemistry, vol. 21, no. 9, pp. 3107-3112. https://doi.org/10.1039/c0jm02829k
Hotchkiss, Peter J. ; Malicki, Michał ; Giordano, Anthony J. ; Armstrong, Neal R ; Marder, Seth R. / Characterization of phosphonic acid binding to zinc oxide. In: Journal of Materials Chemistry. 2011 ; Vol. 21, No. 9. pp. 3107-3112.
@article{2fa15c7590ab47cab2b547745678093d,
title = "Characterization of phosphonic acid binding to zinc oxide",
abstract = "Radio Frequency (RF) sputter-deposited zinc oxide (ZnO) films have been modified with alkylphosphonic acids in order to study both the binding of the phosphonic acid (PA) group to the ZnO surface and the packing of the alkyl chain. The characterization of these PA-modified ZnO substrates by X-ray photoelectron spectroscopy (XPS), infrared reflection-absorption spectroscopy (IRRAS), atomic force microscopy (AFM) and contact angle measurements is presented herein. The surface modification procedure is straightforward and was adapted from earlier work. XPS analysis shows that oxygen plasma (OP) treatment creates reactive oxygen species on the surface of ZnO, allowing for a more robust binding of PAs to the ZnO surface. IRRAS analysis indicates that octadecylphosphonic acid binds to the ZnO surface in a predominantly tridentate fashion, forming dense, well-packed monolayers with alkyl chains in a fully anti-conformation. AFM and contact angle measurements indicate good surface coverage of the PAs with little to no multilayer formation.",
author = "Hotchkiss, {Peter J.} and Michał Malicki and Giordano, {Anthony J.} and Armstrong, {Neal R} and Marder, {Seth R.}",
year = "2011",
month = "3",
day = "7",
doi = "10.1039/c0jm02829k",
language = "English (US)",
volume = "21",
pages = "3107--3112",
journal = "Journal of Materials Chemistry",
issn = "0959-9428",
publisher = "Royal Society of Chemistry",
number = "9",

}

TY - JOUR

T1 - Characterization of phosphonic acid binding to zinc oxide

AU - Hotchkiss, Peter J.

AU - Malicki, Michał

AU - Giordano, Anthony J.

AU - Armstrong, Neal R

AU - Marder, Seth R.

PY - 2011/3/7

Y1 - 2011/3/7

N2 - Radio Frequency (RF) sputter-deposited zinc oxide (ZnO) films have been modified with alkylphosphonic acids in order to study both the binding of the phosphonic acid (PA) group to the ZnO surface and the packing of the alkyl chain. The characterization of these PA-modified ZnO substrates by X-ray photoelectron spectroscopy (XPS), infrared reflection-absorption spectroscopy (IRRAS), atomic force microscopy (AFM) and contact angle measurements is presented herein. The surface modification procedure is straightforward and was adapted from earlier work. XPS analysis shows that oxygen plasma (OP) treatment creates reactive oxygen species on the surface of ZnO, allowing for a more robust binding of PAs to the ZnO surface. IRRAS analysis indicates that octadecylphosphonic acid binds to the ZnO surface in a predominantly tridentate fashion, forming dense, well-packed monolayers with alkyl chains in a fully anti-conformation. AFM and contact angle measurements indicate good surface coverage of the PAs with little to no multilayer formation.

AB - Radio Frequency (RF) sputter-deposited zinc oxide (ZnO) films have been modified with alkylphosphonic acids in order to study both the binding of the phosphonic acid (PA) group to the ZnO surface and the packing of the alkyl chain. The characterization of these PA-modified ZnO substrates by X-ray photoelectron spectroscopy (XPS), infrared reflection-absorption spectroscopy (IRRAS), atomic force microscopy (AFM) and contact angle measurements is presented herein. The surface modification procedure is straightforward and was adapted from earlier work. XPS analysis shows that oxygen plasma (OP) treatment creates reactive oxygen species on the surface of ZnO, allowing for a more robust binding of PAs to the ZnO surface. IRRAS analysis indicates that octadecylphosphonic acid binds to the ZnO surface in a predominantly tridentate fashion, forming dense, well-packed monolayers with alkyl chains in a fully anti-conformation. AFM and contact angle measurements indicate good surface coverage of the PAs with little to no multilayer formation.

UR - http://www.scopus.com/inward/record.url?scp=79951603577&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79951603577&partnerID=8YFLogxK

U2 - 10.1039/c0jm02829k

DO - 10.1039/c0jm02829k

M3 - Article

AN - SCOPUS:79951603577

VL - 21

SP - 3107

EP - 3112

JO - Journal of Materials Chemistry

JF - Journal of Materials Chemistry

SN - 0959-9428

IS - 9

ER -