Characterization of Polarization Aberrations in Liquid Crystal Devices

Justin Wolfe, Russell A Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Reflective Liquid Crystal on Silicon (LCoS) panels are widely used as light valves for projection displays. LCoS panels and the associated beam splitters, retardance films, and dichroic beam splitters display significant variations in polarization properties over the area, angle of incidence and spectral bandwidth of the projector. This paper surveys these polarization aberrations and describes a high speed Mueller Matrix Imaging Polarimeter (MMIP) for the characterization of these polarization aberrations. The characterization of projection systems and components by the MMIP enables advanced modeling and compensation of polarization aberrations.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsA. Duparre, B. Singh
Pages1-5
Number of pages5
Volume5188
DOIs
StatePublished - 2003
EventAdvanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies - San Diego, CA, United States
Duration: Aug 3 2003Aug 5 2003

Other

OtherAdvanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies
CountryUnited States
CitySan Diego, CA
Period8/3/038/5/03

Fingerprint

Aberrations
Liquid crystals
aberration
liquid crystals
Polarization
Polarimeters
beam splitters
polarimeters
polarization
projection
light valves
Imaging techniques
Projection systems
Silicon
silicon
projectors
matrices
incidence
Display devices
high speed

Keywords

  • Imaging polarimeter
  • LCoS projector
  • Liquid crystal
  • Mueller matrix
  • Polarization aberrations

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Wolfe, J., & Chipman, R. A. (2003). Characterization of Polarization Aberrations in Liquid Crystal Devices. In A. Duparre, & B. Singh (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 5188, pp. 1-5) https://doi.org/10.1117/12.505871

Characterization of Polarization Aberrations in Liquid Crystal Devices. / Wolfe, Justin; Chipman, Russell A.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / A. Duparre; B. Singh. Vol. 5188 2003. p. 1-5.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Wolfe, J & Chipman, RA 2003, Characterization of Polarization Aberrations in Liquid Crystal Devices. in A Duparre & B Singh (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 5188, pp. 1-5, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, San Diego, CA, United States, 8/3/03. https://doi.org/10.1117/12.505871
Wolfe J, Chipman RA. Characterization of Polarization Aberrations in Liquid Crystal Devices. In Duparre A, Singh B, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 5188. 2003. p. 1-5 https://doi.org/10.1117/12.505871
Wolfe, Justin ; Chipman, Russell A. / Characterization of Polarization Aberrations in Liquid Crystal Devices. Proceedings of SPIE - The International Society for Optical Engineering. editor / A. Duparre ; B. Singh. Vol. 5188 2003. pp. 1-5
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