Characterization of Polarization Aberrations in Liquid Crystal Devices

Justin Wolfe, Russell Chipman

Research output: Contribution to journalConference article

Abstract

Reflective Liquid Crystal on Silicon (LCoS) panels are widely used as light valves for projection displays. LCoS panels and the associated beam splitters, retardance films, and dichroic beam splitters display significant variations in polarization properties over the area, angle of incidence and spectral bandwidth of the projector. This paper surveys these polarization aberrations and describes a high speed Mueller Matrix Imaging Polarimeter (MMIP) for the characterization of these polarization aberrations. The characterization of projection systems and components by the MMIP enables advanced modeling and compensation of polarization aberrations.

Original languageEnglish (US)
Pages (from-to)1-5
Number of pages5
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5188
DOIs
StatePublished - Dec 1 2003
EventAdvanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies - San Diego, CA, United States
Duration: Aug 3 2003Aug 5 2003

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Keywords

  • Imaging polarimeter
  • LCoS projector
  • Liquid crystal
  • Mueller matrix
  • Polarization aberrations

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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