Characterization of Pt/TiO2 surfaces by means of photoelectron spectroscopy of adsorbed xenon

P. Dolle, K. Markert, W. Heichier, N. R. Armstrong, K. Wandelt

Research output: Contribution to journalArticlepeer-review

13 Scopus citations


Photoelectron spectroscopy of adsorbed Xe (PAX) was used to characterize various Pt/TiO2 (100) surfaces on an atomic scale. The PAX data provide useful information on both geometrical and electronic states of various surface sites. For example, both Ar ion sputtering and high temperature annealing (850°C) in vacuum produce a distribution of (charge density) surface defect sites, most likely Ti3+and Ti2+ whose local surface potentials are higher than on a stoichiometric TiO2 surface by 0.5 and 1 eV, respectively. Submonolayer deposits of Pt on a stoichiometric TiO2 exhibits much lower local surface potentials (0.5-1 eV) than sputter-roughened bulk Pt, suggesting modified charge densities at these sites.

Original languageEnglish (US)
Pages (from-to)1465-1466
Number of pages2
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Issue number3
StatePublished - May 1986
Externally publishedYes

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films


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