Characterization of the optical properties of the buried contact of the JWST MIRI Si: As infrared blocked impurity band detectors

Ioannis Argyriou, George H. Rieke, Michael E. Ressler, András Gáspár, Bart Vandenbussche

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The Mid-Infrared Instrument MIRI on-board the James Webb Space Telescope uses three Si:As impurity band conduction detector arrays. MIRI medium resolution spectroscopic measurements (R∼3500-1500) in the 5 μm to 28 μm wavelength range show a 10-30% modulation of the spectral baseline; coherent reflections of infrared light within the Si:As detector arrays result in fringing. We quantify the shape and impact of fringes on spectra of optical sources observed with MIRI during ground testing and develop an optical model to simulate the observed modulation. We use our optical model in conjunction with the MIRI spectroscopic data to show that the properties of the buried contact inside the MIRI Si:As detector have a significant effect on the fringing behavior.

Original languageEnglish (US)
Title of host publicationX-Ray, Optical, and Infrared Detectors for Astronomy IX
EditorsAndrew D. Holland, James Beletic
PublisherSPIE
ISBN (Electronic)9781510636958
DOIs
StatePublished - 2020
EventX-Ray, Optical, and Infrared Detectors for Astronomy IX 2020 - Virtual, Online, United States
Duration: Dec 14 2020Dec 22 2020

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11454
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceX-Ray, Optical, and Infrared Detectors for Astronomy IX 2020
Country/TerritoryUnited States
CityVirtual, Online
Period12/14/2012/22/20

Keywords

  • Doping concentration
  • Fringing buried contact
  • James Webb Space Telescope
  • Mid infrared instrument MIRI
  • Refractive index
  • Si:As impurity band conduction device
  • Spectroscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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