Characterization of wafer-scale and many-output CCD detectors

Michael Lesser, Roy Tucker

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

The latest CCD detectors destined for advanced astronomical instruments are larger and have more output amplifiers than previous devices. Examples are the Semiconductor Technology Associates, Inc. 16-output STA1600 and STA1900 devices and the 8-output STA2200 Orthogonal Transfer Array CCDs. Back illuminated versions of these devices have been processed and evaluated at the University of Arizona Imaging Technology Laboratory and are the subject of this paper. Characterizing these devices has required new optical testing equipment and optimized techniques to efficiently evaluate device performance. This is especially true when even limited volume production is required. In this paper we discuss the hardware related to characterization of the large format (135 mm diagonal) and 8- and 16- output CCDs at cold temperatures, including quantum efficiency, charge transfer efficiency, noise, full well, cross-talk, and operating parameters. We also discuss related developments in dewar construction and operation, including a hybrid closed cycle and liquid nitrogen cooling system used for long-term testing, the characterization optical system, and related device packaging. We also describe the equipment for wafer level probe testing of the same devices.

Original languageEnglish (US)
Title of host publicationHigh Energy, Optical, and Infrared Detectors for Astronomy III
DOIs
StatePublished - Dec 1 2008
EventHigh Energy, Optical, and Infrared Detectors for Astronomy III - Marseille, France
Duration: Jun 23 2008Jun 26 2008

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7021
ISSN (Print)0277-786X

Other

OtherHigh Energy, Optical, and Infrared Detectors for Astronomy III
CountryFrance
CityMarseille
Period6/23/086/26/08

Keywords

  • CCDs
  • Detectors
  • Imaging
  • Telescopes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Lesser, M., & Tucker, R. (2008). Characterization of wafer-scale and many-output CCD detectors. In High Energy, Optical, and Infrared Detectors for Astronomy III [70211U] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7021). https://doi.org/10.1117/12.788349