Characterization of wafer-scale and many-output CCD detectors

Michael P Lesser, Roy Tucker

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The latest CCD detectors destined for advanced astronomical instruments are larger and have more output amplifiers than previous devices. Examples are the Semiconductor Technology Associates, Inc. 16-output STA1600 and STA1900 devices and the 8-output STA2200 Orthogonal Transfer Array CCDs. Back illuminated versions of these devices have been processed and evaluated at the University of Arizona Imaging Technology Laboratory and are the subject of this paper. Characterizing these devices has required new optical testing equipment and optimized techniques to efficiently evaluate device performance. This is especially true when even limited volume production is required. In this paper we discuss the hardware related to characterization of the large format (135 mm diagonal) and 8- and 16- output CCDs at cold temperatures, including quantum efficiency, charge transfer efficiency, noise, full well, cross-talk, and operating parameters. We also discuss related developments in dewar construction and operation, including a hybrid closed cycle and liquid nitrogen cooling system used for long-term testing, the characterization optical system, and related device packaging. We also describe the equipment for wafer level probe testing of the same devices.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume7021
DOIs
StatePublished - 2008
EventHigh Energy, Optical, and Infrared Detectors for Astronomy III - Marseille, France
Duration: Jun 23 2008Jun 26 2008

Other

OtherHigh Energy, Optical, and Infrared Detectors for Astronomy III
CountryFrance
CityMarseille
Period6/23/086/26/08

Fingerprint

Charge coupled devices
Wafer
charge coupled devices
Detector
wafers
Detectors
output
Output
detectors
Optical testing
Dewars
Testing
Liquid nitrogen
Cooling systems
Quantum efficiency
Optical systems
Charge transfer
Packaging
Semiconductor materials
Hardware

Keywords

  • CCDs
  • Detectors
  • Imaging
  • Telescopes

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Lesser, M. P., & Tucker, R. (2008). Characterization of wafer-scale and many-output CCD detectors. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 7021). [70211U] https://doi.org/10.1117/12.788349

Characterization of wafer-scale and many-output CCD detectors. / Lesser, Michael P; Tucker, Roy.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7021 2008. 70211U.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Lesser, MP & Tucker, R 2008, Characterization of wafer-scale and many-output CCD detectors. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 7021, 70211U, High Energy, Optical, and Infrared Detectors for Astronomy III, Marseille, France, 6/23/08. https://doi.org/10.1117/12.788349
Lesser MP, Tucker R. Characterization of wafer-scale and many-output CCD detectors. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7021. 2008. 70211U https://doi.org/10.1117/12.788349
Lesser, Michael P ; Tucker, Roy. / Characterization of wafer-scale and many-output CCD detectors. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7021 2008.
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