Characterizing dielectric tensors from angle-of-incidence mueller matrix images

Paula K. Smith, Russell A Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Biaxial ellipsometry is a technique that measures the dielectric tensor and thickness of a biaxial substrate, single-layer thin film, or multi-layer structure. The dielectric tensor of a biaxial material consists of the real and imaginary parts of the three orthogonal principal indices (nx+ ikx, ny+ iky and nz + ikz) and three Euler angles (⊖, Φ Δ) to describe its orientation. The method utilized in this work measures an angle-of-incidence Mueller matrix from a Mueller matrix imaging Polarimeter equipped with a pair of microscope objectives with low polarization aberrations. The dielectric tensors for multilayer samples are determined from multi-spectral angle-of-incidence Mueller matrix images in either a transmission or reflection mode using an appropriate dispersion model. Given approximate a priori knowledge of the dielectric tensor and film thickness, a Jones matrix image is first calculated by solving Maxwell's equations at each surface which is then transformed into a Mueller matrix image. An optimization algorithm then finds the best fit dielectric tensor based on matching the measured and calculated angle-of-incidence Mueller matrix images. One use for this application is to more accurately determine the dielectric tensors of biaxial films used in liquid crystal displays.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume6682
DOIs
StatePublished - 2007
EventPolarization Science and Remote Sensing III - San Diego, CA, United States
Duration: Aug 29 2007Aug 30 2007

Other

OtherPolarization Science and Remote Sensing III
CountryUnited States
CitySan Diego, CA
Period8/29/078/30/07

Fingerprint

Tensors
incidence
tensors
matrices
Polarimeters
Wave transmission
Ellipsometry
Maxwell equations
polarimeters
Aberrations
Liquid crystal displays
Maxwell equation
laminates
ellipsometry
Film thickness
aberration
Multilayers
Microscopes
film thickness
liquid crystals

Keywords

  • Biaxial
  • Birefringent
  • Dielectric tensor
  • Ellipsometry
  • Polarimetry

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Smith, P. K., & Chipman, R. A. (2007). Characterizing dielectric tensors from angle-of-incidence mueller matrix images. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 6682). [66820N] https://doi.org/10.1117/12.735335

Characterizing dielectric tensors from angle-of-incidence mueller matrix images. / Smith, Paula K.; Chipman, Russell A.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6682 2007. 66820N.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Smith, PK & Chipman, RA 2007, Characterizing dielectric tensors from angle-of-incidence mueller matrix images. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 6682, 66820N, Polarization Science and Remote Sensing III, San Diego, CA, United States, 8/29/07. https://doi.org/10.1117/12.735335
Smith PK, Chipman RA. Characterizing dielectric tensors from angle-of-incidence mueller matrix images. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6682. 2007. 66820N https://doi.org/10.1117/12.735335
Smith, Paula K. ; Chipman, Russell A. / Characterizing dielectric tensors from angle-of-incidence mueller matrix images. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6682 2007.
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