Characterizing dielectric tensors with biaxial ellipsometry

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Dielectric tensors of liquid crystal polymer retarder films are determined by measuring the sample with an angle-of-incidence Mueller matrix imaging polarimeter. An optimization routine finds the dielectric tensor that best fits the Mueller matrix data.

Original languageEnglish (US)
Title of host publicationOptics InfoBase Conference Papers
PublisherOptical Society of America
ISBN (Print)9781557528612
Publication statusPublished - 2008
EventFrontiers in Optics, FiO 2008 - Rochester, NY, United States
Duration: Oct 19 2008Oct 23 2008

Other

OtherFrontiers in Optics, FiO 2008
CountryUnited States
CityRochester, NY
Period10/19/0810/23/08

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ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Smith, P. K., Mcclain, S. C., & Chipman, R. A. (2008). Characterizing dielectric tensors with biaxial ellipsometry. In Optics InfoBase Conference Papers Optical Society of America.