Characterizing dielectric tensors with Biaxial ellipsometry

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Dielectric tensors of anisotropic substrates and films can be determined by biaxial ellipsometry, an extension of conventional ellipsometry. This technique utilizes an angle-of-incidence Mueller matrix imaging polarimeter. An example of the determination of the dielectric tensor of liquid crystal polymer films for retarders is presented.

Original languageEnglish (US)
Title of host publicationDigest of Technical Papers - SID International Symposium
Pages1533-1536
Number of pages4
Volume39
Edition3
Publication statusPublished - 2008
Event2008 SID International Symposium - Los Angeles, CA, United States
Duration: May 20 2008May 21 2008

Other

Other2008 SID International Symposium
CountryUnited States
CityLos Angeles, CA
Period5/20/085/21/08

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ASJC Scopus subject areas

  • Engineering(all)

Cite this

Smith, P. K., Mcclain, S. C., & Chipman, R. A. (2008). Characterizing dielectric tensors with Biaxial ellipsometry. In Digest of Technical Papers - SID International Symposium (3 ed., Vol. 39, pp. 1533-1536)