Dielectric tensors of anisotropic substrates and films can be determined by biaxial ellipsometry, an extension of conventional ellipsometry. This technique utilizes an angle-of-incidence Mueller matrix imaging polarimeter. An example of the determination of the dielectric tensor of liquid crystal polymer films for retarders is presented.
|Original language||English (US)|
|Number of pages||4|
|Journal||Digest of Technical Papers - SID International Symposium|
|State||Published - Jan 1 2008|
|Event||2008 SID International Symposium - Los Angeles, CA, United States|
Duration: May 20 2008 → May 21 2008
ASJC Scopus subject areas