Characterizing multilayer, low diattenuation mirrors with a mueller matrix imaging polarimeter

Paula K. Smith, Russell A. Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A multilayer, low diattenuation mirror was measured with a Muller matrix imaging polarimeter. The measured diattenuation and absolute reflectance were used to characterize the optical constants of each layer in-situ using a Levenberg-Marguardt optimization.

Original languageEnglish (US)
Title of host publicationOptical Interference Coatings, OIC 2007
PublisherOptical Society of America
ISBN (Print)1557528411, 9781557528414
StatePublished - Jan 1 2007
EventOptical Interference Coatings, OIC 2007 - Tucson, AZ, United States
Duration: Jun 3 2007Jun 3 2007

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherOptical Interference Coatings, OIC 2007
CountryUnited States
CityTucson, AZ
Period6/3/076/3/07

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Smith, P. K., & Chipman, R. A. (2007). Characterizing multilayer, low diattenuation mirrors with a mueller matrix imaging polarimeter. In Optical Interference Coatings, OIC 2007 (Optics InfoBase Conference Papers). Optical Society of America.