Chebyshev affine arithmetic based parametric yield prediction under limited descriptions of uncertainty

Jin Sun, Yue Huang, Janet M. Wang, Jun Li

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations

Abstract

In modern circuit design, it is difficult to provide reliable parametric yield prediction since the real distribution of process data is hard to measure. Most existing approaches are not able to handle the uncertain distribution property coming from the process data. Other approaches are inadequate considering correlations among the parameters. This paper suggests a new approach that not only takes care of the correlations among distributions but also provides a low cost and efficient computation scheme. The proposed method approximates the parameter variations with Chebyshev Affine Arithmetics (CAA) to capture both the uncertainty and the nonlinearity in Cumulative Distribution Functions (CDF). The CAA based probabilistic presentation describes both fully and partially specified process and environmental parameters. Thus we are capable of predicting probability bounds for leakage consumption under unknown dependency assumption among variations. The end result is the chip level parametric yield estimation based on leakage prediction. The experimental results demonstrate that the new approach provides reliable bound estimation while leads to 20% yield improvement comparing with interval analysis.

Original languageEnglish (US)
Title of host publication2008 Asia and South Pacific Design Automation Conference, ASP-DAC
Pages531-536
Number of pages6
DOIs
StatePublished - Aug 21 2008
Event2008 Asia and South Pacific Design Automation Conference, ASP-DAC - Seoul, Korea, Republic of
Duration: Mar 21 2008Mar 24 2008

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Other

Other2008 Asia and South Pacific Design Automation Conference, ASP-DAC
CountryKorea, Republic of
CitySeoul
Period3/21/083/24/08

ASJC Scopus subject areas

  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

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    Sun, J., Huang, Y., Wang, J. M., & Li, J. (2008). Chebyshev affine arithmetic based parametric yield prediction under limited descriptions of uncertainty. In 2008 Asia and South Pacific Design Automation Conference, ASP-DAC (pp. 531-536). [4484008] (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC). https://doi.org/10.1109/ASPDAC.2008.4484008