Chromatic aberration measurement for transmission interferometric testing

Kibyung Seong, John E Greivenkamp

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

A method of chromatic aberration measurement is described based on the transmitted wavefront of an optical element obtained from a Mach-Zehnder interferometer. The chromatic aberration is derived from transmitted wavefronts measured at five different wavelengths. Reverse ray tracing is used to remove induced aberrations associated with the interferometer from the measurement. In the interferometer, the wavefront transmitted through the sample is tested against a piano reference, allowing for the absolute determination of the wavefront radius of curvature. The chromatic aberrations of a singlet and a doublet have been measured.

Original languageEnglish (US)
Pages (from-to)6508-6511
Number of pages4
JournalApplied Optics
Volume47
Issue number35
DOIs
StatePublished - Dec 10 2008

Fingerprint

Wavefronts
Aberrations
aberration
Testing
Interferometers
interferometers
Mach-Zehnder interferometers
Ray tracing
Optical devices
ray tracing
curvature
Wavelength
radii
wavelengths

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Chromatic aberration measurement for transmission interferometric testing. / Seong, Kibyung; Greivenkamp, John E.

In: Applied Optics, Vol. 47, No. 35, 10.12.2008, p. 6508-6511.

Research output: Contribution to journalArticle

@article{834bb93efd394599b1d630c5eaf6ab84,
title = "Chromatic aberration measurement for transmission interferometric testing",
abstract = "A method of chromatic aberration measurement is described based on the transmitted wavefront of an optical element obtained from a Mach-Zehnder interferometer. The chromatic aberration is derived from transmitted wavefronts measured at five different wavelengths. Reverse ray tracing is used to remove induced aberrations associated with the interferometer from the measurement. In the interferometer, the wavefront transmitted through the sample is tested against a piano reference, allowing for the absolute determination of the wavefront radius of curvature. The chromatic aberrations of a singlet and a doublet have been measured.",
author = "Kibyung Seong and Greivenkamp, {John E}",
year = "2008",
month = "12",
day = "10",
doi = "10.1364/AO.47.006508",
language = "English (US)",
volume = "47",
pages = "6508--6511",
journal = "Applied Optics",
issn = "1559-128X",
publisher = "The Optical Society",
number = "35",

}

TY - JOUR

T1 - Chromatic aberration measurement for transmission interferometric testing

AU - Seong, Kibyung

AU - Greivenkamp, John E

PY - 2008/12/10

Y1 - 2008/12/10

N2 - A method of chromatic aberration measurement is described based on the transmitted wavefront of an optical element obtained from a Mach-Zehnder interferometer. The chromatic aberration is derived from transmitted wavefronts measured at five different wavelengths. Reverse ray tracing is used to remove induced aberrations associated with the interferometer from the measurement. In the interferometer, the wavefront transmitted through the sample is tested against a piano reference, allowing for the absolute determination of the wavefront radius of curvature. The chromatic aberrations of a singlet and a doublet have been measured.

AB - A method of chromatic aberration measurement is described based on the transmitted wavefront of an optical element obtained from a Mach-Zehnder interferometer. The chromatic aberration is derived from transmitted wavefronts measured at five different wavelengths. Reverse ray tracing is used to remove induced aberrations associated with the interferometer from the measurement. In the interferometer, the wavefront transmitted through the sample is tested against a piano reference, allowing for the absolute determination of the wavefront radius of curvature. The chromatic aberrations of a singlet and a doublet have been measured.

UR - http://www.scopus.com/inward/record.url?scp=60949106510&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=60949106510&partnerID=8YFLogxK

U2 - 10.1364/AO.47.006508

DO - 10.1364/AO.47.006508

M3 - Article

C2 - 19079457

AN - SCOPUS:60949106510

VL - 47

SP - 6508

EP - 6511

JO - Applied Optics

JF - Applied Optics

SN - 1559-128X

IS - 35

ER -