Combatting infrared focal plane array nonuniformity noise in imaging polarimeters

Bradley M. Ratliff, Rakesh Kumar, Wiley Black, James K. Boger, J Scott Tyo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

One of the most significant challenges in performing infrared (IR) polarimetery is the focal plane array (FPA) nonuniformity (NU) noise that is inherent in virtually all IR photodetector technologies that operate in the midwave IR (MWIR) or long-wave IR (LWIR). NU noise results from pixel-to-pixel variations in the repsonsivity of the photodetectors. This problem is especially severy in the microengineered IR FPA materials like HgCdTe and InSb, as well as in uncooled IR microbolometer sensors. Such problems are largely absent from Si based visible spectrum FPAs. The pixel response is usually a variable nonlinear response function, and even when the response is linearized over some range of temperatures, the gain and offset of the resulting response is usually highly variable. NU noise is normally corrected by applying a linear calibration to the data, but the resulting imagery still retains residual nonuniformity due to the nonlinearity of the photodetector responses. This residual nonuniformity is particularly troublesome for polarimeters because of the addition and subtraction operations that must be performed on the images in order to construct the Stokes parameters or other polarization products. In this paper we explore the impact of NU noise on full stokes and linear-polarization-only IR polarimeters. We compare the performance of division of time, division of amplitude, and division of array polarimeters in the presence of both NU and temporal noise, and assess the ability of calibration-based NU correction schemes to clean up the data.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsJ.A. Shaw, J.S. Tyo
Pages1-10
Number of pages10
Volume5888
DOIs
StatePublished - 2005
Externally publishedYes
EventPolarization Science and Remote Sensing II - San Diego, CA, United States
Duration: Aug 2 2005Aug 4 2005

Other

OtherPolarization Science and Remote Sensing II
CountryUnited States
CitySan Diego, CA
Period8/2/058/4/05

Fingerprint

Polarimeters
Focal plane arrays
focal plane devices
polarimeters
nonuniformity
Infrared radiation
Imaging techniques
Photodetectors
division
photometers
Pixels
pixels
Calibration
Polarization
linear polarization
visible spectrum
planetary waves
subtraction
imagery
nonlinearity

Keywords

  • Infrared Polarimetry
  • Nonuniformity Noise
  • Polarimetry
  • Polarization
  • Remote Sensing

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Ratliff, B. M., Kumar, R., Black, W., Boger, J. K., & Tyo, J. S. (2005). Combatting infrared focal plane array nonuniformity noise in imaging polarimeters. In J. A. Shaw, & J. S. Tyo (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 5888, pp. 1-10). [58880J] https://doi.org/10.1117/12.613075

Combatting infrared focal plane array nonuniformity noise in imaging polarimeters. / Ratliff, Bradley M.; Kumar, Rakesh; Black, Wiley; Boger, James K.; Tyo, J Scott.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / J.A. Shaw; J.S. Tyo. Vol. 5888 2005. p. 1-10 58880J.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ratliff, BM, Kumar, R, Black, W, Boger, JK & Tyo, JS 2005, Combatting infrared focal plane array nonuniformity noise in imaging polarimeters. in JA Shaw & JS Tyo (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 5888, 58880J, pp. 1-10, Polarization Science and Remote Sensing II, San Diego, CA, United States, 8/2/05. https://doi.org/10.1117/12.613075
Ratliff BM, Kumar R, Black W, Boger JK, Tyo JS. Combatting infrared focal plane array nonuniformity noise in imaging polarimeters. In Shaw JA, Tyo JS, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 5888. 2005. p. 1-10. 58880J https://doi.org/10.1117/12.613075
Ratliff, Bradley M. ; Kumar, Rakesh ; Black, Wiley ; Boger, James K. ; Tyo, J Scott. / Combatting infrared focal plane array nonuniformity noise in imaging polarimeters. Proceedings of SPIE - The International Society for Optical Engineering. editor / J.A. Shaw ; J.S. Tyo. Vol. 5888 2005. pp. 1-10
@inproceedings{a3ab447a2fe04286805e9a918b978834,
title = "Combatting infrared focal plane array nonuniformity noise in imaging polarimeters",
abstract = "One of the most significant challenges in performing infrared (IR) polarimetery is the focal plane array (FPA) nonuniformity (NU) noise that is inherent in virtually all IR photodetector technologies that operate in the midwave IR (MWIR) or long-wave IR (LWIR). NU noise results from pixel-to-pixel variations in the repsonsivity of the photodetectors. This problem is especially severy in the microengineered IR FPA materials like HgCdTe and InSb, as well as in uncooled IR microbolometer sensors. Such problems are largely absent from Si based visible spectrum FPAs. The pixel response is usually a variable nonlinear response function, and even when the response is linearized over some range of temperatures, the gain and offset of the resulting response is usually highly variable. NU noise is normally corrected by applying a linear calibration to the data, but the resulting imagery still retains residual nonuniformity due to the nonlinearity of the photodetector responses. This residual nonuniformity is particularly troublesome for polarimeters because of the addition and subtraction operations that must be performed on the images in order to construct the Stokes parameters or other polarization products. In this paper we explore the impact of NU noise on full stokes and linear-polarization-only IR polarimeters. We compare the performance of division of time, division of amplitude, and division of array polarimeters in the presence of both NU and temporal noise, and assess the ability of calibration-based NU correction schemes to clean up the data.",
keywords = "Infrared Polarimetry, Nonuniformity Noise, Polarimetry, Polarization, Remote Sensing",
author = "Ratliff, {Bradley M.} and Rakesh Kumar and Wiley Black and Boger, {James K.} and Tyo, {J Scott}",
year = "2005",
doi = "10.1117/12.613075",
language = "English (US)",
volume = "5888",
pages = "1--10",
editor = "J.A. Shaw and J.S. Tyo",
booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",

}

TY - GEN

T1 - Combatting infrared focal plane array nonuniformity noise in imaging polarimeters

AU - Ratliff, Bradley M.

AU - Kumar, Rakesh

AU - Black, Wiley

AU - Boger, James K.

AU - Tyo, J Scott

PY - 2005

Y1 - 2005

N2 - One of the most significant challenges in performing infrared (IR) polarimetery is the focal plane array (FPA) nonuniformity (NU) noise that is inherent in virtually all IR photodetector technologies that operate in the midwave IR (MWIR) or long-wave IR (LWIR). NU noise results from pixel-to-pixel variations in the repsonsivity of the photodetectors. This problem is especially severy in the microengineered IR FPA materials like HgCdTe and InSb, as well as in uncooled IR microbolometer sensors. Such problems are largely absent from Si based visible spectrum FPAs. The pixel response is usually a variable nonlinear response function, and even when the response is linearized over some range of temperatures, the gain and offset of the resulting response is usually highly variable. NU noise is normally corrected by applying a linear calibration to the data, but the resulting imagery still retains residual nonuniformity due to the nonlinearity of the photodetector responses. This residual nonuniformity is particularly troublesome for polarimeters because of the addition and subtraction operations that must be performed on the images in order to construct the Stokes parameters or other polarization products. In this paper we explore the impact of NU noise on full stokes and linear-polarization-only IR polarimeters. We compare the performance of division of time, division of amplitude, and division of array polarimeters in the presence of both NU and temporal noise, and assess the ability of calibration-based NU correction schemes to clean up the data.

AB - One of the most significant challenges in performing infrared (IR) polarimetery is the focal plane array (FPA) nonuniformity (NU) noise that is inherent in virtually all IR photodetector technologies that operate in the midwave IR (MWIR) or long-wave IR (LWIR). NU noise results from pixel-to-pixel variations in the repsonsivity of the photodetectors. This problem is especially severy in the microengineered IR FPA materials like HgCdTe and InSb, as well as in uncooled IR microbolometer sensors. Such problems are largely absent from Si based visible spectrum FPAs. The pixel response is usually a variable nonlinear response function, and even when the response is linearized over some range of temperatures, the gain and offset of the resulting response is usually highly variable. NU noise is normally corrected by applying a linear calibration to the data, but the resulting imagery still retains residual nonuniformity due to the nonlinearity of the photodetector responses. This residual nonuniformity is particularly troublesome for polarimeters because of the addition and subtraction operations that must be performed on the images in order to construct the Stokes parameters or other polarization products. In this paper we explore the impact of NU noise on full stokes and linear-polarization-only IR polarimeters. We compare the performance of division of time, division of amplitude, and division of array polarimeters in the presence of both NU and temporal noise, and assess the ability of calibration-based NU correction schemes to clean up the data.

KW - Infrared Polarimetry

KW - Nonuniformity Noise

KW - Polarimetry

KW - Polarization

KW - Remote Sensing

UR - http://www.scopus.com/inward/record.url?scp=29244457223&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=29244457223&partnerID=8YFLogxK

U2 - 10.1117/12.613075

DO - 10.1117/12.613075

M3 - Conference contribution

AN - SCOPUS:29244457223

VL - 5888

SP - 1

EP - 10

BT - Proceedings of SPIE - The International Society for Optical Engineering

A2 - Shaw, J.A.

A2 - Tyo, J.S.

ER -