Combined-environment influence on microcrack evolution in mono-crystalline silicon

W. J. Huang, Z. D. Fortuno, M. Li, Jian Liu, Haitao Liao, Kelly Potter, Barrett G Potter

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The impact of combined environment conditions (mechanical state, temperature, and relative humidity) on microcrack propagation characteristics in p-type monocrystalline, photovoltaic-grade Si wafers was examined. A four-point bend apparatus was used to impose static strain conditions in 280 micron thick monocrystalline Si wafers containing microindentation-initiated crack centers. The specimen under test was simultaneously subjected to varied temperature and relative humidity conditions within a controlled environment chamber. Microcrack length was monitored after exposure to two sets of temperature and relative humidity conditions (i.e. 20â.,? and 33%, 40â.,? and 60% respectively) using scanning electron microscopy. Two primary stages of crack elongation behavior were observed under both of the combined environment conditions. Specifically, an early-time, more rapid growth period occurred, followed by more limited crack growth at later times. The deceleration of crack propagation is consistent with stress relaxation accompanying crack elongation under the constant strain conditions imposed. In general, an increase in the average microcrack propagation rate within both growth rate ranges and in the final overall change in average crack length was observed under elevated temperature and humidity conditions. These findings support the probable role of local crack-tip environment on microcrack evolution.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume9179
ISBN (Print)9781628412062
DOIs
StatePublished - 2014
EventReliability of Photovoltaic Cells, Modules, Components, and Systems VII - San Diego, United States
Duration: Aug 20 2014Aug 21 2014

Other

OtherReliability of Photovoltaic Cells, Modules, Components, and Systems VII
CountryUnited States
CitySan Diego
Period8/20/148/21/14

Fingerprint

Microcracks
microcracks
Silicon
Atmospheric humidity
Crystalline materials
Cracks
cracks
silicon
Relative Humidity
humidity
Crack
Elongation
Crack propagation
Temperature
Deceleration
Wafer
Stress relaxation
elongation
Crack tips
wafers

Keywords

  • Microcrack propagation
  • monocrystalline Si
  • photovoltaic

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Huang, W. J., Fortuno, Z. D., Li, M., Liu, J., Liao, H., Potter, K., & Potter, B. G. (2014). Combined-environment influence on microcrack evolution in mono-crystalline silicon. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 9179). [91790T] SPIE. https://doi.org/10.1117/12.2062162

Combined-environment influence on microcrack evolution in mono-crystalline silicon. / Huang, W. J.; Fortuno, Z. D.; Li, M.; Liu, Jian; Liao, Haitao; Potter, Kelly; Potter, Barrett G.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9179 SPIE, 2014. 91790T.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Huang, WJ, Fortuno, ZD, Li, M, Liu, J, Liao, H, Potter, K & Potter, BG 2014, Combined-environment influence on microcrack evolution in mono-crystalline silicon. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 9179, 91790T, SPIE, Reliability of Photovoltaic Cells, Modules, Components, and Systems VII, San Diego, United States, 8/20/14. https://doi.org/10.1117/12.2062162
Huang WJ, Fortuno ZD, Li M, Liu J, Liao H, Potter K et al. Combined-environment influence on microcrack evolution in mono-crystalline silicon. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9179. SPIE. 2014. 91790T https://doi.org/10.1117/12.2062162
Huang, W. J. ; Fortuno, Z. D. ; Li, M. ; Liu, Jian ; Liao, Haitao ; Potter, Kelly ; Potter, Barrett G. / Combined-environment influence on microcrack evolution in mono-crystalline silicon. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9179 SPIE, 2014.
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