Combining a scanning near-field optical microscope with a picosecond streak camera

Statistical analysis of exciton kinetics in GaAs single-quantum wells

U. Neuberth, L. Walter, G. Von Freymann, B. Dal Don, H. Kalt, M. Wegener, Galina Khitrova, H. M. Gibbs

Research output: Contribution to journalArticle

17 Citations (Scopus)

Abstract

Combining a low-temperature scanning near-field optical microscope with a picosecond streak camera allows us to measure the complete wavelength-time behavior at one spot on the sample within about 13 min at excitation powers of 100 nW. We use this instrument to measure the variation of relaxation times in disordered single-GaAs quantum wells with sample position.

Original languageEnglish (US)
Pages (from-to)3340-3342
Number of pages3
JournalApplied Physics Letters
Volume80
Issue number18
DOIs
StatePublished - May 6 2002

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streak cameras
optical microscopes
statistical analysis
near fields
excitons
quantum wells
scanning
kinetics
relaxation time
wavelengths
excitation

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Combining a scanning near-field optical microscope with a picosecond streak camera : Statistical analysis of exciton kinetics in GaAs single-quantum wells. / Neuberth, U.; Walter, L.; Von Freymann, G.; Dal Don, B.; Kalt, H.; Wegener, M.; Khitrova, Galina; Gibbs, H. M.

In: Applied Physics Letters, Vol. 80, No. 18, 06.05.2002, p. 3340-3342.

Research output: Contribution to journalArticle

Neuberth, U. ; Walter, L. ; Von Freymann, G. ; Dal Don, B. ; Kalt, H. ; Wegener, M. ; Khitrova, Galina ; Gibbs, H. M. / Combining a scanning near-field optical microscope with a picosecond streak camera : Statistical analysis of exciton kinetics in GaAs single-quantum wells. In: Applied Physics Letters. 2002 ; Vol. 80, No. 18. pp. 3340-3342.
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