Combining a scanning near-field optical microscope with a picosecond streak camera: Statistical analysis of exciton kinetics in GaAs single-quantum wells

U. Neuberth, L. Walter, G. Von Freymann, B. Dal Don, H. Kalt, M. Wegener, G. Khitrova, H. M. Gibbs

Research output: Contribution to journalArticle

17 Scopus citations

Abstract

Combining a low-temperature scanning near-field optical microscope with a picosecond streak camera allows us to measure the complete wavelength-time behavior at one spot on the sample within about 13 min at excitation powers of 100 nW. We use this instrument to measure the variation of relaxation times in disordered single-GaAs quantum wells with sample position.

Original languageEnglish (US)
Pages (from-to)3340-3342
Number of pages3
JournalApplied Physics Letters
Volume80
Issue number18
DOIs
StatePublished - May 6 2002

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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