Combining ray-trace and diffraction analysis: a design example

Tom D. Milster, Jeffrey P. Treptau

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present an example of using a combined ray trace and diffraction modeling code to simulate effects of objective-lens tilt in an optical data storage device.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherPubl by Int Soc for Optical Engineering
Pages108-112
Number of pages5
ISBN (Print)0819407712
StatePublished - Jan 1 1992
EventDesign, Modeling, and Control of Laser Beam Optics - Los Angeles, CA, USA
Duration: Jan 21 1992Jan 23 1992

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1625
ISSN (Print)0277-786X

Other

OtherDesign, Modeling, and Control of Laser Beam Optics
CityLos Angeles, CA, USA
Period1/21/921/23/92

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Combining ray-trace and diffraction analysis: a design example'. Together they form a unique fingerprint.

Cite this