Comparison of power dependence of microwave surface resistance of unpatterned and patterned YBCO thin film

Hao Xin, Daniel E. Oates, A. C. Anderson

Research output: Contribution to journalArticle

28 Citations (Scopus)

Abstract

The effect of the patterning process on the nonlinearity of the microwave surface resistance R$ of YBCO thin films is investigated in this paper. With the use of a sapphire dielectric resonator and a stripline resonator, the microwave R§ of YBCO thin films was measured before and after the patterning process, as a function of temperature and the RF peak magnetic field in the film. The microwave loss was also modeled, assuming a Jrf dependence of Zs(Jrf) on current density Jrf. Experimental and modeled results show that the patterning has no observable effect on the microwave residual RS or on the power dependence of R$.

Original languageEnglish (US)
Pages (from-to)1221-1226
Number of pages6
JournalIEEE Transactions on Microwave Theory and Techniques
Volume48
Issue number7 PART 2
DOIs
StatePublished - 2000
Externally publishedYes

Fingerprint

Surface resistance
Microwaves
microwaves
Thin films
thin films
resonators
Strip telecommunication lines
Dielectric resonators
Sapphire
Resonators
sapphire
Current density
nonlinearity
Magnetic fields
current density
magnetic fields
Temperature
temperature

Keywords

  • High-temperature superconductors
  • Superconducting films
  • Superconducting materials measurements
  • Superconducting microwave devices
  • Superconducting resonators

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Comparison of power dependence of microwave surface resistance of unpatterned and patterned YBCO thin film. / Xin, Hao; Oates, Daniel E.; Anderson, A. C.

In: IEEE Transactions on Microwave Theory and Techniques, Vol. 48, No. 7 PART 2, 2000, p. 1221-1226.

Research output: Contribution to journalArticle

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