Comparison of smoothness-constrained and geostatistically based cross-borehole electrical resistivity tomography for characterization of solute tracer plumes

Andreas Englert, Andreas Kemna, Jun feng Zhu, Jan Vanderborght, Harry Vereecken, Tian Chyi J. Yeh

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Fingerprint

Dive into the research topics of 'Comparison of smoothness-constrained and geostatistically based cross-borehole electrical resistivity tomography for characterization of solute tracer plumes'. Together they form a unique fingerprint.

Engineering & Materials Science