Computation of electron diffraction patterns in Lorentz electron microscopy of thin magnetic films

Research output: Contribution to journalArticle

34 Scopus citations

Abstract

The vector potential field for a thin magnetic film with arbitrary pattern of magnetization is calculated using fast Fourier transforms. The vector potential is used to compute the phase modulation imparted to the electron beam in Lorentz electron microscopy. Calculated phase patterns and the corresponding intensity distributions for several magnetic configurations of practical interest are described.

Original languageEnglish (US)
Pages (from-to)2455-2464
Number of pages10
JournalJournal of Applied Physics
Volume69
Issue number4
DOIs
StatePublished - Dec 1 1991

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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