Computation of fields and forces in magnetic force microscopy

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

In magnetic force microscopy (MFM), a sharp magnetic needle interacts with the field pattern established by the sample near its surface. A cantilever then converts the force on the needle to a displacement, which is measured interferometrically or otherwise. The author describes a model for the tip that takes full account of the micromagnetic interactions involved. The stray magnetic field for a thin film is computed, and the micromagnetic model of the needle is developed. An example calculation is given to illustrate the application of the model.

Original languageEnglish (US)
Pages (from-to)3467-3469
Number of pages3
JournalIEEE Transactions on Magnetics
Volume25
Issue number5
DOIs
StatePublished - Sep 1989

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Magnetic force microscopy
magnetic force microscopy
needles
Needles
Magnetic fields
Thin films
thin films
magnetic fields
interactions

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Physics and Astronomy (miscellaneous)

Cite this

Computation of fields and forces in magnetic force microscopy. / Mansuripur, Masud.

In: IEEE Transactions on Magnetics, Vol. 25, No. 5, 09.1989, p. 3467-3469.

Research output: Contribution to journalArticle

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