Conductivity and magnetoresistance in magnetic granular films (invited)

Shufeng Zhang, Peter M. Levy

Research output: Contribution to journalArticle

316 Citations (Scopus)

Abstract

The transport properties in magnetic granular films are modeled by considering the spin-dependent impurity scattering within the granules and the interface roughness scattering at the boundaries of the granules. The magnetoresistance for these films is derived by using the formalism developed for layered structures with currents perpendicular to the plane of the layers and which is applicable to random systems. With this model, various features of the magnetoresistance observed in recent experiments can be explained and the optimal choice of parameters to maximize the magnetoresistance can be determined.

Original languageEnglish (US)
Pages (from-to)5315-5319
Number of pages5
JournalJournal of Applied Physics
Volume73
Issue number10
DOIs
StatePublished - 1993
Externally publishedYes

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conductivity
scattering
roughness
transport properties
formalism
impurities

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Conductivity and magnetoresistance in magnetic granular films (invited). / Zhang, Shufeng; Levy, Peter M.

In: Journal of Applied Physics, Vol. 73, No. 10, 1993, p. 5315-5319.

Research output: Contribution to journalArticle

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