Consideration and control of writing conditions with a near-field APSIL probe

Shu Guo Tang; Thomas D Milster; D. O'Connell; M. Bailey

doi:10.1109/OMODS.2002.1028629

Consideration and control of writing conditions with a near-field APSIL probe

Shu Guo Tang, Thomas D Milster, D. O'Connell, M. Bailey

Optical Sciences, College of

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The Solid Immersion Lenses (SIL) and aperture probes are two near field optical techniques that are capable of generating smaller spot size than that of far-field optical systems. Neither technique can generate both ultra-small spot size and exhibit high optical efficiency. Small spot size produces higher contrast signals, which leads to an increase in signal-to-noise ratio (SNR) and an enlargement in the capacity of an optical disk. Higher optical efficiency gives higher throughput in the optical system, which accelerates data rate. The technique of near-field Aperture SIL (APSIL), which combines a dielectric aperture probe and a SIL, is a promising method to achieve both small spot size and high optical efficiency. The objective of this paper is to explore the writing conditions for implementing APSIL to reduce mark size to a fraction of that from the far-field data storage systems. In this paper, we investigate the effect of polarization of the light on the spot profile and the optimal axial focus position by experiments and simulations.

Original language	English (US)
Title of host publication	2002 International Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002, Technical Digest
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	243-245
Number of pages	3
ISBN (Print)	0780373790, 9780780373792
DOIs	https://doi.org/10.1109/OMODS.2002.1028629
State	Published - 2002
Event	International Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002 - Waikoloa, United States Duration: Jul 7 2002 → Jul 11 2002

Other

Other	International Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002
Country/Territory	United States
City	Waikoloa
Period	7/7/02 → 7/11/02

ASJC Scopus subject areas

Hardware and Architecture
Electronic, Optical and Magnetic Materials

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10.1109/OMODS.2002.1028629

Cite this

Tang, S. G., Milster, T. D., O'Connell, D., & Bailey, M. (2002). Consideration and control of writing conditions with a near-field APSIL probe. In 2002 International Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002, Technical Digest (pp. 243-245). [1028629] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/OMODS.2002.1028629

Consideration and control of writing conditions with a near-field APSIL probe. / Tang, Shu Guo; Milster, Thomas D; O'Connell, D.; Bailey, M.

2002 International Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002, Technical Digest. Institute of Electrical and Electronics Engineers Inc., 2002. p. 243-245 1028629.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Tang, SG, Milster, TD, O'Connell, D & Bailey, M 2002, Consideration and control of writing conditions with a near-field APSIL probe. in 2002 International Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002, Technical Digest., 1028629, Institute of Electrical and Electronics Engineers Inc., pp. 243-245, International Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002, Waikoloa, United States, 7/7/02. https://doi.org/10.1109/OMODS.2002.1028629

Tang SG, Milster TD, O'Connell D, Bailey M. Consideration and control of writing conditions with a near-field APSIL probe. In 2002 International Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002, Technical Digest. Institute of Electrical and Electronics Engineers Inc. 2002. p. 243-245. 1028629 https://doi.org/10.1109/OMODS.2002.1028629

Tang, Shu Guo ; Milster, Thomas D ; O'Connell, D. ; Bailey, M. / Consideration and control of writing conditions with a near-field APSIL probe. 2002 International Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002, Technical Digest. Institute of Electrical and Electronics Engineers Inc., 2002. pp. 243-245

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abstract = "The Solid Immersion Lenses (SIL) and aperture probes are two near field optical techniques that are capable of generating smaller spot size than that of far-field optical systems. Neither technique can generate both ultra-small spot size and exhibit high optical efficiency. Small spot size produces higher contrast signals, which leads to an increase in signal-to-noise ratio (SNR) and an enlargement in the capacity of an optical disk. Higher optical efficiency gives higher throughput in the optical system, which accelerates data rate. The technique of near-field Aperture SIL (APSIL), which combines a dielectric aperture probe and a SIL, is a promising method to achieve both small spot size and high optical efficiency. The objective of this paper is to explore the writing conditions for implementing APSIL to reduce mark size to a fraction of that from the far-field data storage systems. In this paper, we investigate the effect of polarization of the light on the spot profile and the optimal axial focus position by experiments and simulations.",

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Consideration and control of writing conditions with a near-field APSIL probe

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