Control focused soft error detection for embedded applications

Karthik Shankar, Roman L Lysecky

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Advances in integrated circuits present several key challenges in system reliability as soft errors are expected to increase with successive technology generations. Computing systems must be able to continue functioning in spite of these soft errors, necessitating the development of new methods for self-healing circuits that can detect and recover from these errors. We present an area-efficient control focused soft error detector (CNFSED) capable of nonintrusively detecting soft errors within the execution of a software application without modifications to the software application or the target processor. This soft error detector achieves an error detection rate greater than 90% for control errors and 85% of unmasked errors while incurring minimal area overhead.

Original languageEnglish (US)
Article number5629436
Pages (from-to)127-130
Number of pages4
JournalIEEE Embedded Systems Letters
Volume2
Issue number4
DOIs
StatePublished - Dec 2010

Fingerprint

Error detection
Application programs
Detectors
Integrated circuits
Networks (circuits)

Keywords

  • Dynamic profiling
  • multicore systems
  • multitasking
  • real-time embedded systems
  • soft error detection

ASJC Scopus subject areas

  • Computer Science(all)
  • Control and Systems Engineering

Cite this

Control focused soft error detection for embedded applications. / Shankar, Karthik; Lysecky, Roman L.

In: IEEE Embedded Systems Letters, Vol. 2, No. 4, 5629436, 12.2010, p. 127-130.

Research output: Contribution to journalArticle

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