Count rate statistics for drift detectors

Philip J. Pietraski, Lars R Furenlid

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Solid state drill detectors have emerged as a promising technology for high count-rate, high energy-resolution applications, e.g. X-ray spectroscopy and inelastic scattering experiments at synchrotron light sources. In such devices, the charge carriers generated from the absorption of a photon in the detector medium are made to drift through a region that has an electric field defined by field shaping electrodes before approaching and inducing a signal on a sensing electrode. Since all charges drift to this one location, there is a time delay between the occurrence of an event (absorption of a photon) and the generation of the electrode signal which is dependent on the position of the event. In this work, we consider what effect this has on the pile-up statistics. We derive expressions for the cases of a continuous X-ray source, a pulsed source with period that is either much less than the shaper support time or much less than the average drift time, and a pulsed source with a period that is long or comparable to both the shaper support and the drift time.

Original languageEnglish (US)
Title of host publicationIEEE Nuclear Science Symposium and Medical Imaging Conference
EditorsD. Merelli, J. Surget, M. Ulma
Volume2
StatePublished - 2000
Event2000 IEEE Nuclear Science Symposium Conference Record - Lyon, France
Duration: Oct 15 2000Oct 20 2000

Other

Other2000 IEEE Nuclear Science Symposium Conference Record
CountryFrance
CityLyon
Period10/15/0010/20/00

Fingerprint

Statistics
Detectors
Electrodes
Photons
Inelastic scattering
X ray spectroscopy
Charge carriers
Synchrotrons
Piles
Light sources
Time delay
Electric fields
X rays
Experiments

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Industrial and Manufacturing Engineering

Cite this

Pietraski, P. J., & Furenlid, L. R. (2000). Count rate statistics for drift detectors. In D. Merelli, J. Surget, & M. Ulma (Eds.), IEEE Nuclear Science Symposium and Medical Imaging Conference (Vol. 2)

Count rate statistics for drift detectors. / Pietraski, Philip J.; Furenlid, Lars R.

IEEE Nuclear Science Symposium and Medical Imaging Conference. ed. / D. Merelli; J. Surget; M. Ulma. Vol. 2 2000.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Pietraski, PJ & Furenlid, LR 2000, Count rate statistics for drift detectors. in D Merelli, J Surget & M Ulma (eds), IEEE Nuclear Science Symposium and Medical Imaging Conference. vol. 2, 2000 IEEE Nuclear Science Symposium Conference Record, Lyon, France, 10/15/00.
Pietraski PJ, Furenlid LR. Count rate statistics for drift detectors. In Merelli D, Surget J, Ulma M, editors, IEEE Nuclear Science Symposium and Medical Imaging Conference. Vol. 2. 2000
Pietraski, Philip J. ; Furenlid, Lars R. / Count rate statistics for drift detectors. IEEE Nuclear Science Symposium and Medical Imaging Conference. editor / D. Merelli ; J. Surget ; M. Ulma. Vol. 2 2000.
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