Crystallization and amorphization studies on a Ge2Sb2Te5 thin film sample using a two-laser static tester

Pramod K. Khulbe, Xiaodong Xun, Masud Mansuripur

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The results obtained in a novel, two-laser static tester are described, which allows real time monitoring of the crystallization/amorphization processes both during the laser pulse and in the cooling period following the pulse. The two-laser static tester is based on a commercial white light microscope. Crystallization/amorphization studies were conducted for the thermal characterization of phase change media on a set of five quadrilayer samples. The samples have varying thicknesses of GeSbTe and dielectric layers.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages211-213
Number of pages3
Volume3864
StatePublished - 1999
EventProceedings of the 1999 Joint International Symposium on Optical Memory and Optical Optical Data Storage (ISOM/ODS'99) - Koloa, HI, USA
Duration: Jul 12 1999Jul 15 1999

Other

OtherProceedings of the 1999 Joint International Symposium on Optical Memory and Optical Optical Data Storage (ISOM/ODS'99)
CityKoloa, HI, USA
Period7/12/997/15/99

Fingerprint

Amorphization
test equipment
Laser pulses
Crystallization
crystallization
Thin films
Lasers
thin films
lasers
Microscopes
Cooling
pulses
Monitoring
microscopes
cooling
Hot Temperature

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Khulbe, P. K., Xun, X., & Mansuripur, M. (1999). Crystallization and amorphization studies on a Ge2Sb2Te5 thin film sample using a two-laser static tester. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3864, pp. 211-213). Society of Photo-Optical Instrumentation Engineers.

Crystallization and amorphization studies on a Ge2Sb2Te5 thin film sample using a two-laser static tester. / Khulbe, Pramod K.; Xun, Xiaodong; Mansuripur, Masud.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3864 Society of Photo-Optical Instrumentation Engineers, 1999. p. 211-213.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Khulbe, PK, Xun, X & Mansuripur, M 1999, Crystallization and amorphization studies on a Ge2Sb2Te5 thin film sample using a two-laser static tester. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 3864, Society of Photo-Optical Instrumentation Engineers, pp. 211-213, Proceedings of the 1999 Joint International Symposium on Optical Memory and Optical Optical Data Storage (ISOM/ODS'99), Koloa, HI, USA, 7/12/99.
Khulbe PK, Xun X, Mansuripur M. Crystallization and amorphization studies on a Ge2Sb2Te5 thin film sample using a two-laser static tester. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3864. Society of Photo-Optical Instrumentation Engineers. 1999. p. 211-213
Khulbe, Pramod K. ; Xun, Xiaodong ; Mansuripur, Masud. / Crystallization and amorphization studies on a Ge2Sb2Te5 thin film sample using a two-laser static tester. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3864 Society of Photo-Optical Instrumentation Engineers, 1999. pp. 211-213
@inproceedings{19c5912dba634e7aa4382603a08e25bd,
title = "Crystallization and amorphization studies on a Ge2Sb2Te5 thin film sample using a two-laser static tester",
abstract = "The results obtained in a novel, two-laser static tester are described, which allows real time monitoring of the crystallization/amorphization processes both during the laser pulse and in the cooling period following the pulse. The two-laser static tester is based on a commercial white light microscope. Crystallization/amorphization studies were conducted for the thermal characterization of phase change media on a set of five quadrilayer samples. The samples have varying thicknesses of GeSbTe and dielectric layers.",
author = "Khulbe, {Pramod K.} and Xiaodong Xun and Masud Mansuripur",
year = "1999",
language = "English (US)",
volume = "3864",
pages = "211--213",
booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "Society of Photo-Optical Instrumentation Engineers",

}

TY - GEN

T1 - Crystallization and amorphization studies on a Ge2Sb2Te5 thin film sample using a two-laser static tester

AU - Khulbe, Pramod K.

AU - Xun, Xiaodong

AU - Mansuripur, Masud

PY - 1999

Y1 - 1999

N2 - The results obtained in a novel, two-laser static tester are described, which allows real time monitoring of the crystallization/amorphization processes both during the laser pulse and in the cooling period following the pulse. The two-laser static tester is based on a commercial white light microscope. Crystallization/amorphization studies were conducted for the thermal characterization of phase change media on a set of five quadrilayer samples. The samples have varying thicknesses of GeSbTe and dielectric layers.

AB - The results obtained in a novel, two-laser static tester are described, which allows real time monitoring of the crystallization/amorphization processes both during the laser pulse and in the cooling period following the pulse. The two-laser static tester is based on a commercial white light microscope. Crystallization/amorphization studies were conducted for the thermal characterization of phase change media on a set of five quadrilayer samples. The samples have varying thicknesses of GeSbTe and dielectric layers.

UR - http://www.scopus.com/inward/record.url?scp=0033338189&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0033338189&partnerID=8YFLogxK

M3 - Conference contribution

VL - 3864

SP - 211

EP - 213

BT - Proceedings of SPIE - The International Society for Optical Engineering

PB - Society of Photo-Optical Instrumentation Engineers

ER -