Crystallization and amorphization studies on a Ge2Sb2Te5 thin film sample using a two-laser static tester

Pramod K. Khulbe, Xiaodong Xun, M. Mansuripur

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations


The results obtained in a novel, two-laser static tester are described, which allows real time monitoring of the crystallization/amorphization processes both during the laser pulse and in the cooling period following the pulse. The two-laser static tester is based on a commercial white light microscope. Crystallization/amorphization studies were conducted for the thermal characterization of phase change media on a set of five quadrilayer samples. The samples have varying thicknesses of GeSbTe and dielectric layers.

Original languageEnglish (US)
Pages (from-to)211-213
Number of pages3
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - 1999
EventProceedings of the 1999 Joint International Symposium on Optical Memory and Optical Optical Data Storage (ISOM/ODS'99) - Koloa, HI, USA
Duration: Jul 12 1999Jul 15 1999

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


Dive into the research topics of 'Crystallization and amorphization studies on a Ge<sub>2</sub>Sb<sub>2</sub>Te<sub>5</sub> thin film sample using a two-laser static tester'. Together they form a unique fingerprint.

Cite this