Crystallization behavior of Ge-doped eutectic Sb70Te30films in optical disks

Pramod K. Khulbe, Terril Hurst, Michikazu Horie, Masud Mansuripur

Research output: Contribution to journalArticlepeer-review

39 Scopus citations

Abstract

We report laser-induced crystallization behavior of binary Sb–Te and ternary Ge-doped eutectic Sb70Te30thin film samples in a typical quadrilayer stack as used in phase-change optical disk data storage. Several experiments have been conducted on a two-laser static tester in which one laser operating in pulse mode writes crystalline marks on amorphous film or amorphous marks on crystalline film, while the second laser operating at low-power cw mode simultaneously monitors the progress of the crystalline or amorphous mark formation in real time in terms of the reflectivity variation. The results of this study show that the crystallization kinetics of this class of film is strongly growth dominant, which is significantly different from the crystallization kinetics of stochiometric Ge–Sb–Te compositions. In Sb–Te and Ge-doped eutectic Sb70Te30thin-film samples, the crystallization behavior of the two forms of amorphous states, namely, as-deposited amorphous state and melt-quenched amorphous state, remains approximately same. We have also presented experiments showing the effect of the variation of the Sb/Te ratio and Ge doping on the crystallization behavior of these films.

Original languageEnglish (US)
Pages (from-to)6220-6229
Number of pages10
JournalApplied optics
Volume41
Issue number29
DOIs
StatePublished - Oct 10 2002

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering

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