DATA ACQUISITION AND PROCESSING MODES FOR QUANTITATIVE AUGER ELECTRON SPECTROSCOPY.

Michael C. Burrell, Roy S. Kaller, Neal R Armstrong

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

Auger electron spectroscopy has been applied to the quantitative surface analysis of a series of metals (Ag, Cd, In, Sn), indium-tin alloys, indium and tin oxides, and indium-tin oxide (ITO) films. Spectra were obtained by two methods: (1) the conventional modulation technique, which results in the derivative spectrum, and (2) a direct current measurement, which gives an undifferentiated spectrum. For data collected in the latter mode, an instrumental approach and secondary electron background correlation are discussed. Quantitative results obtained by using this approach are shown to be more accurate than the traditional measurement method.

Original languageEnglish (US)
Pages (from-to)2511-2517
Number of pages7
JournalAnalytical Chemistry
Volume54
Issue number14
StatePublished - Dec 1982

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Auger electron spectroscopy
Data acquisition
Indium alloys
Tin alloys
Electron correlations
Surface analysis
Electric current measurement
Oxide films
Metals
Modulation
Derivatives
indium tin oxide

ASJC Scopus subject areas

  • Analytical Chemistry

Cite this

DATA ACQUISITION AND PROCESSING MODES FOR QUANTITATIVE AUGER ELECTRON SPECTROSCOPY. / Burrell, Michael C.; Kaller, Roy S.; Armstrong, Neal R.

In: Analytical Chemistry, Vol. 54, No. 14, 12.1982, p. 2511-2517.

Research output: Contribution to journalArticle

Burrell, Michael C. ; Kaller, Roy S. ; Armstrong, Neal R. / DATA ACQUISITION AND PROCESSING MODES FOR QUANTITATIVE AUGER ELECTRON SPECTROSCOPY. In: Analytical Chemistry. 1982 ; Vol. 54, No. 14. pp. 2511-2517.
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