Data extraction from terahertz time domain spectroscopy measurements

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

The potential of terahertz (THz) time domain spectroscopy to simultaneously determine the complex dielectric parameters of materials and their geometrical thickness is of high interest for scientific spectroscopy and for general metrology. This paper provides an overview of the background of the data extraction from THz measurements and discusses the accuracy and ambiguity of this extraction process. It is shown that the signal to noise ratio of the measurement as well as the bandwidth of the accessible THz spectrum define the limitation of the achievable accuracy in the data extraction.

Original languageEnglish (US)
Pages (from-to)638-648
Number of pages11
JournalJournal of Infrared, Millimeter, and Terahertz Waves
Volume35
Issue number8
DOIs
StatePublished - 2014

Fingerprint

Spectroscopy
spectroscopy
ambiguity
metrology
Signal to noise ratio
signal to noise ratios
bandwidth
Bandwidth

Keywords

  • Data analysis
  • Fabry-Perót
  • Parameter extraction
  • Terahertz
  • Thickness determination

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Radiation
  • Instrumentation
  • Electrical and Electronic Engineering

Cite this

Data extraction from terahertz time domain spectroscopy measurements. / Scheller, Maik A.

In: Journal of Infrared, Millimeter, and Terahertz Waves, Vol. 35, No. 8, 2014, p. 638-648.

Research output: Contribution to journalArticle

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