Deflectometry measurement of Daniel K. Inouye Solar Telescope primary mirror

Research output: Chapter in Book/Report/Conference proceedingConference contribution

14 Scopus citations

Abstract

SCOTS (Software Configurable Optical Test System) is a high-precision slope measurement technique based on deflectometry. It utilizes a well-calibrated commercial LCD screen and a diffraction-limited camera to provide high dynamic range, non-contact and full-field metrology of reflective/refractive optics of high accuracy but low cost. Recently, we applied this metrology method on the fabrication of the primary mirror of Daniel K. Inouye Solar Telescope (DKIST), which is a 4.2 meter off-axis parabolic segment with more than 8 mm peak-to-valley aspheric departure. Sophisticated calibrations and compensations including camera mapping, screen nonlinearity and screen shape deformation are performed to achieve high accuracy measurement results. By measuring the mirror at different orientations, non-symmetrical systematic errors are eliminated. The metrology system also includes dual cameras that provide self-verification test. The measurement results are being used to guide the fabrication process.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume9575
ISBN (Print)9781628417418
DOIs
StatePublished - 2015
EventOptical Manufacturing and Testing XI - San Diego, United States
Duration: Aug 9 2015Aug 11 2015

Other

OtherOptical Manufacturing and Testing XI
CountryUnited States
CitySan Diego
Period8/9/158/11/15

Keywords

  • aspheric
  • calibration
  • deflectometry
  • Metrology
  • telescope

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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  • Cite this

    Huang, R., Su, P., & Burge, J. H. (2015). Deflectometry measurement of Daniel K. Inouye Solar Telescope primary mirror. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 9575). [957515] SPIE. https://doi.org/10.1117/12.2189258