Demonstration of bias-controlled algorithmic tuning of quantum dots in a well (DWELL) MidIR detectors

Woo Yong Jang, Majeed M. Hayat, J Scott Tyo, Ram S. Attaluri, Thomas E. Vandervelde, Yagya D. Sharma, Rajeev Shenoi, Andreas Stintz, Elizabeth R. Cantwell, Steven C. Bender, Sang Jun Lee, Sam Kyu Noh, Sanjay Krishna

Research output: Contribution to journalArticle

23 Citations (Scopus)

Abstract

The quantum-confined Stark effect in intersublevel transitions present in quantum-dots-in-a-well (DWELL) detectors gives rise to a midIR spectral response that is dependent upon the detector's operational bias. The spectral responses resulting from different biases exhibit spectral shifts, albeit with significant spectral overlap. A postprocessing algorithm was developed by Sakoǧlu et al. that exploited this bias-dependent spectral diversity to predict the continuous and arbitrary tunability of the DWELL detector within certain limits. This paper focuses on the experimental demonstration of the DWELL-based spectral tuning algorithm. It is shown experimentally that it is possible to reconstruct the spectral content of a target electronically without using any dispersive optical elements for tuning, thereby demonstrating a DWELL-based algorithmic spectrometer. The effects of dark current, detector temperature, and bias selection on the tuning capability are also investigated experimentally.

Original languageEnglish (US)
Pages (from-to)674-683
Number of pages10
JournalIEEE Journal of Quantum Electronics
Volume45
Issue number6
DOIs
StatePublished - 2009

Fingerprint

Semiconductor quantum dots
Demonstrations
Tuning
tuning
quantum dots
Detectors
detectors
spectral sensitivity
Stark effect
Dark currents
Optical devices
dark current
Spectrometers
spectrometers
shift
Temperature
temperature

Keywords

  • Algorithmic spectrometer
  • Filtering algorithms
  • IEEE
  • Optical detectors
  • Prediction algorithms
  • Quantum dots
  • Quantum-dots-in-a-well (DWELL) detectors
  • Spectral sensors
  • Spectral tuning
  • Stark effect
  • Tuning

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics

Cite this

Demonstration of bias-controlled algorithmic tuning of quantum dots in a well (DWELL) MidIR detectors. / Jang, Woo Yong; Hayat, Majeed M.; Tyo, J Scott; Attaluri, Ram S.; Vandervelde, Thomas E.; Sharma, Yagya D.; Shenoi, Rajeev; Stintz, Andreas; Cantwell, Elizabeth R.; Bender, Steven C.; Lee, Sang Jun; Noh, Sam Kyu; Krishna, Sanjay.

In: IEEE Journal of Quantum Electronics, Vol. 45, No. 6, 2009, p. 674-683.

Research output: Contribution to journalArticle

Jang, WY, Hayat, MM, Tyo, JS, Attaluri, RS, Vandervelde, TE, Sharma, YD, Shenoi, R, Stintz, A, Cantwell, ER, Bender, SC, Lee, SJ, Noh, SK & Krishna, S 2009, 'Demonstration of bias-controlled algorithmic tuning of quantum dots in a well (DWELL) MidIR detectors', IEEE Journal of Quantum Electronics, vol. 45, no. 6, pp. 674-683. https://doi.org/10.1109/JQE.2009.2013150
Jang, Woo Yong ; Hayat, Majeed M. ; Tyo, J Scott ; Attaluri, Ram S. ; Vandervelde, Thomas E. ; Sharma, Yagya D. ; Shenoi, Rajeev ; Stintz, Andreas ; Cantwell, Elizabeth R. ; Bender, Steven C. ; Lee, Sang Jun ; Noh, Sam Kyu ; Krishna, Sanjay. / Demonstration of bias-controlled algorithmic tuning of quantum dots in a well (DWELL) MidIR detectors. In: IEEE Journal of Quantum Electronics. 2009 ; Vol. 45, No. 6. pp. 674-683.
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