Design and analysis of a hybrid X-ray transmission and diffraction system

Joel A. Greenberg, Josh Carpenter, David Coccarelli, Yijun Ding, Shu Yang, Emily Fang, Kris Brumbaugh, Christopher Gregory, Amit Ashok, Anuj J. Kapadia, Michael E. Gehm

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Aviation security, mail inspection, medical diagnostics and many other industries all face the same challenge: to accurately identify the presence of a target material concealed within a cluttered surrounding environment. X-ray systems that combine transmission and diffraction measurements promise excellent detection performance with low false alarm rates; however, conventional approaches to combining these measurements typically under-utilize the available information and result in higher overall system resource costs. Here, we consider a fully integrated approach to hybrid X-ray transmission and diffraction systems and discuss simulation- and experimental-based investigations of the design and performance (both imaging and detection) of such systems. Based on this analysis, we describe a hybrid system capable of scanning boxes and/or luggage and report its ability to distinguish materials of interest to aviation security and pharmaceutical inspection.

Original languageEnglish (US)
Title of host publicationAnomaly Detection and Imaging with X-Rays (ADIX) VI
EditorsAmit Ashok, Joel A. Greenberg, Michael E. Gehm
PublisherSPIE
ISBN (Electronic)9781510643130
DOIs
StatePublished - 2021
EventAnomaly Detection and Imaging with X-Rays (ADIX) VI 2021 - Virtual, Online, United States
Duration: Apr 12 2021Apr 16 2021

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11738
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceAnomaly Detection and Imaging with X-Rays (ADIX) VI 2021
Country/TerritoryUnited States
CityVirtual, Online
Period4/12/214/16/21

Keywords

  • Computed tomography
  • Simulation
  • Synthetic data
  • X-ray diffraction
  • X-ray imaging

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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