Design and risk evaluation of reliability demonstration test for hierarchical systems with multilevel information aggregation

Mingyang Li, Weidong Zhang, Qingpei Hu, Huairui Guo, Jian Liu

Research output: Contribution to journalArticle

9 Scopus citations

Abstract

As reliability requirements become increasingly demanding for many engineering systems, conventional system reliability demonstration testing (SRDT) based on the number of failures depends on a large sample of system units. However, for many safety critical systems, such as missiles, it is prohibitive to perform such testing with large samples. To reduce the sample size, existing SRDT methods utilize test data from either system level or component level. In this paper, an aggregation-based SRDT methodology is proposed for hierarchical systems by utilizing multilevel reliability information of components, subsystems, and the overall system. Analytical conditions are identified for the proposed method to achieve lower consumer risk. The performances of different SRDT design strategies are evaluated and compared according to their consumer risks. A numerical case study is presented to illustrate the proposed methodology and demonstrate its validity and effectiveness.

Original languageEnglish (US)
Article number7752922
Pages (from-to)135-147
Number of pages13
JournalIEEE Transactions on Reliability
Volume66
Issue number1
DOIs
StatePublished - Mar 1 2017

Keywords

  • Bayesian reliability
  • hierarchical series-parallel system
  • independent test trials
  • prior specification
  • success-failure test

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering

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