Design issues for substrate-mode holograms used in optical interconnects

Jang Hun Yeh, Raymond K. Kostuk

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

In this paper we discuss a number of issues which affect the performance tolerances of substrate mode holograms (SMHs) used for optical interconnect systems. We examine the effects of emulsion uniformity, thickness variation, and index variation on the ability to accurately determine the diffraction angle within the substrate. The experimental results for the environment stability of SMHs are presented. The effects of emulsion thickness change and cross-coupling on the diffraction efficiency of a 1 × 2 multiplexed SMH are also described.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsStephen A. Benton
PublisherPubl by Society of Photo-Optical Instrumentation Engineers
Pages207-217
Number of pages11
ISBN (Print)0819414719
StatePublished - Dec 1 1994
EventPractical Holography VIII - San Jose, CA, USA
Duration: Feb 7 1994Feb 9 1994

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2176
ISSN (Print)0277-786X

Other

OtherPractical Holography VIII
CitySan Jose, CA, USA
Period2/7/942/9/94

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Yeh, J. H., & Kostuk, R. K. (1994). Design issues for substrate-mode holograms used in optical interconnects. In S. A. Benton (Ed.), Proceedings of SPIE - The International Society for Optical Engineering (pp. 207-217). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2176). Publ by Society of Photo-Optical Instrumentation Engineers.