Determination of emersed electrochemical interface thickness by ellipsometry: Aqueous electrolytes on Ag

Kimball J. Woelfel, Jeanne E Pemberton

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

An ellipsometric method for the determination of emersed electrochemical interfacial thickness at metal electrodes is reported. To demonstrate the effectiveness of this technique, a series of layers on Ag electrodes emersed from aqueous electrolytes are characterized. For most electrolytes, the measured thickness of the emersed interface is consistent with separation of the interface from bulk solution just outside of the outer Helmholtz plane. This behavior is discussed in terms of the various forces involved in structuring the electrochemical interface.

Original languageEnglish (US)
Pages (from-to)161-169
Number of pages9
JournalJournal of Electroanalytical Chemistry
Volume456
Issue number1-2
StatePublished - Sep 30 1998

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Ellipsometry
Electrolytes
Electrodes
Metals

Keywords

  • Ag electrodes
  • Electrochemical interface
  • Helmholtz plane

ASJC Scopus subject areas

  • Chemical Engineering(all)
  • Analytical Chemistry
  • Electrochemistry

Cite this

Determination of emersed electrochemical interface thickness by ellipsometry : Aqueous electrolytes on Ag. / Woelfel, Kimball J.; Pemberton, Jeanne E.

In: Journal of Electroanalytical Chemistry, Vol. 456, No. 1-2, 30.09.1998, p. 161-169.

Research output: Contribution to journalArticle

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