Determination of interface atomic structure and its impact on spin transport using Z-contrast microscopy and density-functional theory

Thomas Zega, Aubrey T. Hanbicki, Steven C. Erwin, Igor Žutić, George Kioseoglou, Connie H. Li, Berend T. Jonker, Rhonda M. Stroud

Research output: Contribution to journalArticle

65 Citations (Scopus)

Abstract

We combine Z-contrast scanning transmission electron microscopy with density-functional-theory calculations to determine the atomic structure of the Fe/AlGaAs interface in spin-polarized light-emitting diodes. A 44% increase in spin-injection efficiency occurs after a low-temperature anneal, which produces an ordered, coherent interface consisting of a single atomic plane of alternating Fe and As atoms. First-principles transport calculations indicate that the increase in spin-injection efficiency is due to the abruptness and coherency of the annealed interface.

Original languageEnglish (US)
Article number196101
JournalPhysical Review Letters
Volume96
Issue number19
DOIs
StatePublished - 2006
Externally publishedYes

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atomic structure
density functional theory
microscopy
injection
polarized light
aluminum gallium arsenides
light emitting diodes
transmission electron microscopy
scanning electron microscopy
atoms

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Determination of interface atomic structure and its impact on spin transport using Z-contrast microscopy and density-functional theory. / Zega, Thomas; Hanbicki, Aubrey T.; Erwin, Steven C.; Žutić, Igor; Kioseoglou, George; Li, Connie H.; Jonker, Berend T.; Stroud, Rhonda M.

In: Physical Review Letters, Vol. 96, No. 19, 196101, 2006.

Research output: Contribution to journalArticle

Zega, Thomas ; Hanbicki, Aubrey T. ; Erwin, Steven C. ; Žutić, Igor ; Kioseoglou, George ; Li, Connie H. ; Jonker, Berend T. ; Stroud, Rhonda M. / Determination of interface atomic structure and its impact on spin transport using Z-contrast microscopy and density-functional theory. In: Physical Review Letters. 2006 ; Vol. 96, No. 19.
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