Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements

Chubing Peng, Rongguang Liang, J. Kevin Erwin, Warren Bletscher, Kenichi Nagata, Masud Mansuripur

Research output: Contribution to journalArticle

9 Scopus citations

Fingerprint Dive into the research topics of 'Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy