Determination of the electronic structure of organic Schottky contacts by photoemission spectroscopy

R. Schlaf, L. A. Crisafulli, H. Murata, C. D. Merritt, Z. H. Kafafi, P. G. Schroeder, M. W. Nelson, B. A. Parkinson, P. A. Lee, K. W. Nebesny, Neal R Armstrong

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

The alignment of the highest occupied and lowest unoccupied molecular orbitals (HOMO, LUMO) of the organic luminescent semiconductor Gaq3 relative to the Fermi level of Au was determined by depositing a Gaq3 thin film in a multi-step growth procedure on an Au foil. Before growth and after each deposition step the sample was characterized by combined x-ray and ultraviolet photoemission spectroscopy (XPS, UPS) measurements. Such measurements offer a direct way to determine the electronic structure of the interface. Our experiments demonstrate that this method allows distinguishing between band bending, charging and interface dipole related shifts in the UP-spectra. The additional XPS measurements allow the precise determination of the band bending occurring across the interface while comparison between XPS and UPS work function measurements allows one to pinpoint the organic film thickness dependent onset of charging phenomena. Our results show that the interface dipoles at Gaq3 Schottky contacts with Au, Pt and Ag amount to 0.6-0.7 eV. Our experiments also show that final state screening shifts can be dismissed as insignificant in such orbital line-up measurements. This was shown at the chloroindium phthalocyanine (ClInPc)/highly oriented pyrolytic graphite (HOPG) interface where no such shifts were observed.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages189-197
Number of pages9
Volume3797
StatePublished - 1999
Externally publishedYes
EventProceedings of the 1999 Organic Light-Emitting Materials and Devices III - Denver, CO, USA
Duration: Jul 19 1999Jul 21 1999

Other

OtherProceedings of the 1999 Organic Light-Emitting Materials and Devices III
CityDenver, CO, USA
Period7/19/997/21/99

Fingerprint

Photoelectron spectroscopy
Electronic structure
electric contacts
photoelectric emission
electronic structure
X ray photoelectron spectroscopy
spectroscopy
charging
shift
dipoles
Molecular orbitals
Fermi level
Ultraviolet spectroscopy
pyrolytic graphite
Metal foil
Film thickness
Screening
Graphite
Experiments
foils

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Schlaf, R., Crisafulli, L. A., Murata, H., Merritt, C. D., Kafafi, Z. H., Schroeder, P. G., ... Armstrong, N. R. (1999). Determination of the electronic structure of organic Schottky contacts by photoemission spectroscopy. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3797, pp. 189-197). Society of Photo-Optical Instrumentation Engineers.

Determination of the electronic structure of organic Schottky contacts by photoemission spectroscopy. / Schlaf, R.; Crisafulli, L. A.; Murata, H.; Merritt, C. D.; Kafafi, Z. H.; Schroeder, P. G.; Nelson, M. W.; Parkinson, B. A.; Lee, P. A.; Nebesny, K. W.; Armstrong, Neal R.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3797 Society of Photo-Optical Instrumentation Engineers, 1999. p. 189-197.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Schlaf, R, Crisafulli, LA, Murata, H, Merritt, CD, Kafafi, ZH, Schroeder, PG, Nelson, MW, Parkinson, BA, Lee, PA, Nebesny, KW & Armstrong, NR 1999, Determination of the electronic structure of organic Schottky contacts by photoemission spectroscopy. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 3797, Society of Photo-Optical Instrumentation Engineers, pp. 189-197, Proceedings of the 1999 Organic Light-Emitting Materials and Devices III, Denver, CO, USA, 7/19/99.
Schlaf R, Crisafulli LA, Murata H, Merritt CD, Kafafi ZH, Schroeder PG et al. Determination of the electronic structure of organic Schottky contacts by photoemission spectroscopy. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3797. Society of Photo-Optical Instrumentation Engineers. 1999. p. 189-197
Schlaf, R. ; Crisafulli, L. A. ; Murata, H. ; Merritt, C. D. ; Kafafi, Z. H. ; Schroeder, P. G. ; Nelson, M. W. ; Parkinson, B. A. ; Lee, P. A. ; Nebesny, K. W. ; Armstrong, Neal R. / Determination of the electronic structure of organic Schottky contacts by photoemission spectroscopy. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3797 Society of Photo-Optical Instrumentation Engineers, 1999. pp. 189-197
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AU - Schroeder, P. G.

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