Determining maximum shear stress in confined substrate from elastic wave reflection coefficient

Jin Xia Liu, Zhi Wen Cui, Ke Xie Wang, Tribikram Kundu

Research output: Research - peer-reviewArticle

Abstract

The relationship between the maximum shear stress in a substrate solid and the elastic wave reflection coefficient from the interface between the substrate solid and an overlying solid half-space is investigated. Both substrate and overlying solid media are assumed to be initially isotropic and stress-free. Then as the substrate is subjected to horizontal confined stresses it becomes anisotropic. It is shown that longitudinal and shear wave reflection coefficients are related to the degree of stress induced anisotropy in the substrate medium. From this relation the confined stress level and the maximum shear stress generated on the vertical planes of the substrate are estimated. Authors in their previous investigation computed plane wave reflection coefficient in a biaxially compressed solid substrate immersed in a fluid. This paper reports for the first time how the maximum shear stress in a biaxially compressed substrate medium can be measured from the plane wave reflection coefficients when the overlying medium is also a solid half-space.

LanguageEnglish (US)
Pages1-12
Number of pages12
JournalScience China Earth Sciences
DOIs
StateAccepted/In press - Mar 23 2017

Fingerprint

wave reflection
elastic wave
shear stress
substrate
half space
S-wave
anisotropy
fluid

Keywords

  • Reflection coefficients
  • Shear stress
  • Stress induced anisotropy

ASJC Scopus subject areas

  • Earth and Planetary Sciences(all)

Cite this

Determining maximum shear stress in confined substrate from elastic wave reflection coefficient. / Liu, Jin Xia; Cui, Zhi Wen; Wang, Ke Xie; Kundu, Tribikram.

In: Science China Earth Sciences, 23.03.2017, p. 1-12.

Research output: Research - peer-reviewArticle

@article{94cc6d587a944c96adac3cca33a2742e,
title = "Determining maximum shear stress in confined substrate from elastic wave reflection coefficient",
abstract = "The relationship between the maximum shear stress in a substrate solid and the elastic wave reflection coefficient from the interface between the substrate solid and an overlying solid half-space is investigated. Both substrate and overlying solid media are assumed to be initially isotropic and stress-free. Then as the substrate is subjected to horizontal confined stresses it becomes anisotropic. It is shown that longitudinal and shear wave reflection coefficients are related to the degree of stress induced anisotropy in the substrate medium. From this relation the confined stress level and the maximum shear stress generated on the vertical planes of the substrate are estimated. Authors in their previous investigation computed plane wave reflection coefficient in a biaxially compressed solid substrate immersed in a fluid. This paper reports for the first time how the maximum shear stress in a biaxially compressed substrate medium can be measured from the plane wave reflection coefficients when the overlying medium is also a solid half-space.",
keywords = "Reflection coefficients, Shear stress, Stress induced anisotropy",
author = "Liu, {Jin Xia} and Cui, {Zhi Wen} and Wang, {Ke Xie} and Tribikram Kundu",
year = "2017",
month = "3",
doi = "10.1007/s11430-016-9011-7",
pages = "1--12",
journal = "Science China Earth Sciences",
issn = "1674-7313",
publisher = "Science in China Press",

}

TY - JOUR

T1 - Determining maximum shear stress in confined substrate from elastic wave reflection coefficient

AU - Liu,Jin Xia

AU - Cui,Zhi Wen

AU - Wang,Ke Xie

AU - Kundu,Tribikram

PY - 2017/3/23

Y1 - 2017/3/23

N2 - The relationship between the maximum shear stress in a substrate solid and the elastic wave reflection coefficient from the interface between the substrate solid and an overlying solid half-space is investigated. Both substrate and overlying solid media are assumed to be initially isotropic and stress-free. Then as the substrate is subjected to horizontal confined stresses it becomes anisotropic. It is shown that longitudinal and shear wave reflection coefficients are related to the degree of stress induced anisotropy in the substrate medium. From this relation the confined stress level and the maximum shear stress generated on the vertical planes of the substrate are estimated. Authors in their previous investigation computed plane wave reflection coefficient in a biaxially compressed solid substrate immersed in a fluid. This paper reports for the first time how the maximum shear stress in a biaxially compressed substrate medium can be measured from the plane wave reflection coefficients when the overlying medium is also a solid half-space.

AB - The relationship between the maximum shear stress in a substrate solid and the elastic wave reflection coefficient from the interface between the substrate solid and an overlying solid half-space is investigated. Both substrate and overlying solid media are assumed to be initially isotropic and stress-free. Then as the substrate is subjected to horizontal confined stresses it becomes anisotropic. It is shown that longitudinal and shear wave reflection coefficients are related to the degree of stress induced anisotropy in the substrate medium. From this relation the confined stress level and the maximum shear stress generated on the vertical planes of the substrate are estimated. Authors in their previous investigation computed plane wave reflection coefficient in a biaxially compressed solid substrate immersed in a fluid. This paper reports for the first time how the maximum shear stress in a biaxially compressed substrate medium can be measured from the plane wave reflection coefficients when the overlying medium is also a solid half-space.

KW - Reflection coefficients

KW - Shear stress

KW - Stress induced anisotropy

UR - http://www.scopus.com/inward/record.url?scp=85016003577&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85016003577&partnerID=8YFLogxK

U2 - 10.1007/s11430-016-9011-7

DO - 10.1007/s11430-016-9011-7

M3 - Article

SP - 1

EP - 12

JO - Science China Earth Sciences

T2 - Science China Earth Sciences

JF - Science China Earth Sciences

SN - 1674-7313

ER -