Development and characterization of a new Er3+ doped phosphate glass for planar waveguide lasers and amplifiers

Shibin Jiang, Seppo Honkanen, Tao Luo, Bor Chyuan Hwang, Gualtiero Nunzi-Conti, Michael Myers, Daniel Rhonehouse, Nasser N Peyghambarian

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A new Er3+ doped phosphate glass exhibiting an excellent durability in both boiling water and NaNO3 molten salt was developed. Ion-exchange process of this glass was investigated by treating glass samples in a variety of salt bathes with various exposure times. Planar waveguide with one mode at 1.54 μm and three modes at 632.8nm was demonstrated. Spectral properties of Er3+ in this glass were characterized by measuring absorption and emission spectra, and fluorescence lifetimes. Emission cross section of Er3+ in this glass was calculated to be 0.76×10-20 cm2 using McCumber theory. Our preliminary experimental results indicate this new Er3+ doped glass is an excellent material for ion-exchanged waveguide lasers and amplifiers.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsS. Jiang, S Honkanen
Pages40-45
Number of pages6
Volume3280
DOIs
Publication statusPublished - 1998
EventRare-Earth-Doped Materials and Devices II - San Jose, CA, United States
Duration: Jan 26 1998Jan 27 1998

Other

OtherRare-Earth-Doped Materials and Devices II
CountryUnited States
CitySan Jose, CA
Period1/26/981/27/98

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Keywords

  • Amplifier
  • Erbium
  • Ion-exahange
  • Laser
  • Phosphate glass
  • Wavegide

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Jiang, S., Honkanen, S., Luo, T., Hwang, B. C., Nunzi-Conti, G., Myers, M., ... Peyghambarian, N. N. (1998). Development and characterization of a new Er3+ doped phosphate glass for planar waveguide lasers and amplifiers. In S. Jiang, & S. Honkanen (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3280, pp. 40-45) https://doi.org/10.1117/12.305405