Dielectric and ferroelectric characterization of sol-gel derived Ca-doped PbTiO3 thin films

G. Teowee, K. C. McCarthy, E. K. Franke, J. M. Boulton, T. P. Alexander, T. J. Bukowski, Donald R Uhlmann

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

A series of sol-gel derived CaTiO3-PbTiO3 thin films (i.e. Pb1-xCaxTiO3 with x = 0-1) was prepared on platinized Si substrates and fired to temperatures ranging from 550 °C to 650 °C. Multiple spincoating was performed to obtain films up to 0.5 μm thick with an intermediate firing of 400 °C between coatings. After the final crystallization firing, top Pt electrodes were sputtered to form monolithic capacitors. These capacitors were subjected to dielectric and ferroelectric characterization using an impedance analyzer and Radiant Technology RT66A Ferroelectric Test System. XRD was used to study the phase development and phase assembly of the fired films. All compositions were single perovskite phase after firing to 600 °C. The effects of Ca content on the crystallization behavior and ferroelectric properties are discussed.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium - Proceedings
PublisherMaterials Research Society
Pages431-436
Number of pages6
Volume433
StatePublished - 1996
Externally publishedYes
EventProceedings of the 1996 MRS Spring Symposium - San Francisco, CA, USA
Duration: Apr 7 1996Apr 12 1996

Other

OtherProceedings of the 1996 MRS Spring Symposium
CitySan Francisco, CA, USA
Period4/7/964/12/96

Fingerprint

Ferroelectric materials
Sol-gels
Crystallization
Thin films
Capacitors
Perovskite
Coatings
Electrodes
Substrates
Chemical analysis
Temperature
perovskite

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Teowee, G., McCarthy, K. C., Franke, E. K., Boulton, J. M., Alexander, T. P., Bukowski, T. J., & Uhlmann, D. R. (1996). Dielectric and ferroelectric characterization of sol-gel derived Ca-doped PbTiO3 thin films. In Materials Research Society Symposium - Proceedings (Vol. 433, pp. 431-436). Materials Research Society.

Dielectric and ferroelectric characterization of sol-gel derived Ca-doped PbTiO3 thin films. / Teowee, G.; McCarthy, K. C.; Franke, E. K.; Boulton, J. M.; Alexander, T. P.; Bukowski, T. J.; Uhlmann, Donald R.

Materials Research Society Symposium - Proceedings. Vol. 433 Materials Research Society, 1996. p. 431-436.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Teowee, G, McCarthy, KC, Franke, EK, Boulton, JM, Alexander, TP, Bukowski, TJ & Uhlmann, DR 1996, Dielectric and ferroelectric characterization of sol-gel derived Ca-doped PbTiO3 thin films. in Materials Research Society Symposium - Proceedings. vol. 433, Materials Research Society, pp. 431-436, Proceedings of the 1996 MRS Spring Symposium, San Francisco, CA, USA, 4/7/96.
Teowee G, McCarthy KC, Franke EK, Boulton JM, Alexander TP, Bukowski TJ et al. Dielectric and ferroelectric characterization of sol-gel derived Ca-doped PbTiO3 thin films. In Materials Research Society Symposium - Proceedings. Vol. 433. Materials Research Society. 1996. p. 431-436
Teowee, G. ; McCarthy, K. C. ; Franke, E. K. ; Boulton, J. M. ; Alexander, T. P. ; Bukowski, T. J. ; Uhlmann, Donald R. / Dielectric and ferroelectric characterization of sol-gel derived Ca-doped PbTiO3 thin films. Materials Research Society Symposium - Proceedings. Vol. 433 Materials Research Society, 1996. pp. 431-436
@inproceedings{dde36c78d9184aad864941fe6aa46384,
title = "Dielectric and ferroelectric characterization of sol-gel derived Ca-doped PbTiO3 thin films",
abstract = "A series of sol-gel derived CaTiO3-PbTiO3 thin films (i.e. Pb1-xCaxTiO3 with x = 0-1) was prepared on platinized Si substrates and fired to temperatures ranging from 550 °C to 650 °C. Multiple spincoating was performed to obtain films up to 0.5 μm thick with an intermediate firing of 400 °C between coatings. After the final crystallization firing, top Pt electrodes were sputtered to form monolithic capacitors. These capacitors were subjected to dielectric and ferroelectric characterization using an impedance analyzer and Radiant Technology RT66A Ferroelectric Test System. XRD was used to study the phase development and phase assembly of the fired films. All compositions were single perovskite phase after firing to 600 °C. The effects of Ca content on the crystallization behavior and ferroelectric properties are discussed.",
author = "G. Teowee and McCarthy, {K. C.} and Franke, {E. K.} and Boulton, {J. M.} and Alexander, {T. P.} and Bukowski, {T. J.} and Uhlmann, {Donald R}",
year = "1996",
language = "English (US)",
volume = "433",
pages = "431--436",
booktitle = "Materials Research Society Symposium - Proceedings",
publisher = "Materials Research Society",

}

TY - GEN

T1 - Dielectric and ferroelectric characterization of sol-gel derived Ca-doped PbTiO3 thin films

AU - Teowee, G.

AU - McCarthy, K. C.

AU - Franke, E. K.

AU - Boulton, J. M.

AU - Alexander, T. P.

AU - Bukowski, T. J.

AU - Uhlmann, Donald R

PY - 1996

Y1 - 1996

N2 - A series of sol-gel derived CaTiO3-PbTiO3 thin films (i.e. Pb1-xCaxTiO3 with x = 0-1) was prepared on platinized Si substrates and fired to temperatures ranging from 550 °C to 650 °C. Multiple spincoating was performed to obtain films up to 0.5 μm thick with an intermediate firing of 400 °C between coatings. After the final crystallization firing, top Pt electrodes were sputtered to form monolithic capacitors. These capacitors were subjected to dielectric and ferroelectric characterization using an impedance analyzer and Radiant Technology RT66A Ferroelectric Test System. XRD was used to study the phase development and phase assembly of the fired films. All compositions were single perovskite phase after firing to 600 °C. The effects of Ca content on the crystallization behavior and ferroelectric properties are discussed.

AB - A series of sol-gel derived CaTiO3-PbTiO3 thin films (i.e. Pb1-xCaxTiO3 with x = 0-1) was prepared on platinized Si substrates and fired to temperatures ranging from 550 °C to 650 °C. Multiple spincoating was performed to obtain films up to 0.5 μm thick with an intermediate firing of 400 °C between coatings. After the final crystallization firing, top Pt electrodes were sputtered to form monolithic capacitors. These capacitors were subjected to dielectric and ferroelectric characterization using an impedance analyzer and Radiant Technology RT66A Ferroelectric Test System. XRD was used to study the phase development and phase assembly of the fired films. All compositions were single perovskite phase after firing to 600 °C. The effects of Ca content on the crystallization behavior and ferroelectric properties are discussed.

UR - http://www.scopus.com/inward/record.url?scp=0030387789&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0030387789&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0030387789

VL - 433

SP - 431

EP - 436

BT - Materials Research Society Symposium - Proceedings

PB - Materials Research Society

ER -